Used HITACHI S-4700 #293815654 for sale

HITACHI S-4700 is a scanning electron microscope (SEM) renowned for its superb image resolution and 3-D capabilities. It is available in two configurations; HITACHI S 4700 type II for general SEM imaging and S-4700 FESEM for imaging at extremely low voltages. Image resolution is among the best in its class, with an electron wavelength of 0.018nm and a primary energy resolution of 0.9nm. S 4700 also has an optional deep trench imaging capability that can image trenches with a depth of up to 100nm. HITACHI S-4700 is operated through a simple, intuitive computer interface. The system supports multiple operating modes including standard secondary-electron, ultra-low-voltage secondary-electron, backscattered-electron, EDX and BSE detector images. HITACHI S 4700 is designed to facilitate sample preparation and enable rapid, high-resolution imaging. It boasts a high-performance tension/tilt sample stage and can accommodate specimens up to 200mm in diameter. The system also features a high-vacuum preparation chamber and a variable pressure scanning filter. S-4700 delivers data acquisition speeds of up to 70 frames per second, allowing users to capture three-dimensional images with exceptional clarity and detail. The images have a maximum resolution of up to 5nm, enabling users to see the fine details of their samples. S 4700 is equipped with an energy-dispersive X-ray (EDX) spectroscopy module for elemental analysis. The module is capable of conducting a variety of high-precision, high-accuracy analyses, including trace-level analysis, multi-element analysis and quantitative analysis. HITACHI S-4700 is a high-performance imaging system suitable for a wide range of applications. It is ideal for nanotechnology research, materials science, failure analysis and semiconductor circuit analysis.