Used HITACHI S-4700 #293829170 for sale

HITACHI S-4700 Scanning Electron Microscope (SEM) is an advanced imaging and analysis tool for the study of nanostructured materials. It combines superior imaging capabilities with a unique, ultra-high resolution filtration equipment to give researchers the highest level of analytical data available. HITACHI S 4700 is equipped with a state-of-the-art electron gun that accurately directs a focused beam of electrons at a sample. Those electrons interact with the atoms in the sample, generating a signal that is subsequently collected by a highly sensitive detector. The electrons then return to the specimen stage where they are focused and redirected to the detector. S-4700's electronic gun is the key component to its superior resolution. Its dual-filter system combines two filters - an outer field filter that filters out any signal that may interfere with the image and an inner field filter that further refines the signal. The combination of the two filters gives users the highest possible signal-to-noise ratio, ensuring better images and resolution. S 4700 can be equipped with a variety of analysis and detection accessories. This includes a four-element dispersion-corrected optics unit for enhanced accuracy in measuring areas of distinct contrast, as well as a tilt/stage machine for 3D imaging. HITACHI S-4700 also offers a variety of image acquisition and analysis software. In addition to the standard image collections, it is compatible with a range of visualization and analysis software for advanced microstructural characterization. The SEM's software can also be used to run specialized imaging programs and computerized tomography methods to perform 3D imaging and materials science applications. HITACHI S 4700 is an ideal tool for a variety of applications in materials science, geology, medicine and other fields. With its superior imaging and analysis capabilities, S-4700 Scanning Electron Microscope is a powerful tool for the study of nanostructured materials.