Used HITACHI S-4700 #9058859 for sale
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ID: 9058859
Vintage: 1998
Field emission scanning electron microscope (FE SEM)
Type I
Resolution:
Accelerating voltage: 15 kV
Working distance: 12 mm 1.5 nm
Accelerating voltage: 1 kV
Working distance: 2.5 mm 2.5 nm
Magnification:
High magnification mode: 100x to 500,000x
Low magnification mode: 20x to 2,000x
Electron optics:
Electron gun: Cold cathode field emission
Extracting voltage (Vext): 0 to 6.5kV
Accelerating voltage (Vacc): 0.5 to 30kV (in 100V steps)
Lens: 3-stage electromagnetic lens, reduction type
Objective lens aperture: Moveable aperture
(4) Openings selectable / Align-able outside column
Self-cleaning thin aperture
Astigmatism correction coil (Stigmator): Electromagnetic type
Scanning coil: 2-stage electromagnetic-deflection type
Specimen stage:
X Traverse o to 25 mm (Continuous)
Y Traverse o to 25 mm (Continuous)
Z Traverse 2.5 to 27.5 mm (Continuous)
Tilt -50 to +450
Rotation: 3600 (Continuous)
Specimen size (Airlock type specimen exchange)
Maximum: 100 mm (Diameter)
Display unit:
Display type: Flicker- free image on PC monitor (Full scanning speeds)
Viewing monitor: Type 17
Color: 1024 x 768 pixels
Photo CRT (Option): Ultra-high resolution type (Effective field of view 120 x 90 mm)
Scanning modes: Normal
Reduced area
Photo
Split/Dual magnification
Line
Position setting
Spot
AAF (Analysis Area Finder)
SAA (Selected Area Analysis)
Scanning speeds: Fast
Slow: 0.5 to 40 see for frame viewing
For photo mode: 20/17, 40/33, 80/67, 160/167, 320/333
Fast: NTSC or PAL signal Value of (50 HZ)/(60 Hz)
Signal processing modes:
Automatic brightness control
Gamma control
Automatic focus
Automatic stigmator
Automatic data display:
Film number
Accelerating voltage
Magnification
Micron bar
Micron value
Date / Time and working distance
Data entry:
Alphanumeric characters
Numbers and marks can be written on image from keyboard
Electrical image shift: +/- 15um (WD = 12mm)
Evacuation system:
System type: Fully automatic pneumatic-valve
Ultimate vacuum levels: Specimen chamber 7 x 10'4 Pa
Electron gun chamber:
IP-1 2 x 10'7 Pa
IP-2 2 x 10'6 Pa
IP-3 7 x 10'5 Pa
Vacuum pumps: Electron optical system: (3) Ion pumps
Specimen chamber: Oil diffusion pump
Turbo molecular pump (option)
(2) Oil rotary pumps
Oil-less type compressor
Protection devices:
Warning devices power failure
Cooling-water interruption
Inadequate vacuum
Others:
Acoustic noise Less than 65 dB
Dielectric voltage-withstand: 1500VAC/1min
No EDX
1998 vintage.
HITACHI S-4700 is an advanced scanning electron microscope (SEM) designed for a range of high-performance applications. The microscope combines a high resolution and magnification imaging with a wide range of specimen observation modes. HITACHI S 4700 features a redesigned control system, called the SmartMeister, which optimizes the operation and data acquisition experience. The SmartMeister's user-friendly interface is designed to make the complex data analysis process easier to understand and allows users to make quick adjustments to the imaging conditions. The instrument is equipped with a variable vacuum chamber, which ensures precise observation of specimens while maintaining a high degree of image resolution. The variable vacuum chamber also helps significantly reduce contamination by preventing the entry of air into the chamber. S-4700 enables high-resolution imaging with nanometer-scale resolution and magnification of up to 300,000x. The instrument also incorporates a wide range of control and analysis functions, including advanced analytical software that can be customized to meet diverse requirements. The microscope includes observation modes such as secondary electron imaging (SEI), backscatter electron imaging (BEI), energy dispersive spectroscopy (EDS) and electron backscattering diffraction (EBSD). These modes allow for detailed analysis of a wide spectrum of material properties, including compositional demography, topography, and the evaluation of local electric fields. S 4700 is capable of producing 3D images of objects and is equipped with automated operation capabilities, enabling time-saving and consistent operation. The instrument also includes a large specimen stage, an automated sample change mechanism, a fully automated viewing system, and support for the implementation of automated workflow processes. Overall, HITACHI S-4700 is an advanced scanning electron microscope designed for a range of high-performance applications. This instrument incorporates a variety of control and analysis functions, enabling detailed analysis of material properties and automation capabilities for efficient operation.
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