Used HITACHI S-4700 #9151037 for sale

HITACHI S-4700
ID: 9151037
Scanning Electron Microscope (SEM) With EDX.
HITACHI S-4700 is a field-emission scanning electron microscope (FE-SEM) engineered to provide high-resolution imaging and data acquisition in a wide range of situations. This instrument is ideal for nanoscale measurements and analysis of samples with very small feature sizes. The high-performance equipment enables ultra-high resolution images and quantitative elemental analysis with low sample preparation, as well as easy operation and maintenance. HITACHI S 4700's advanced microscope design enables simultaneous observation of static and dynamic processes with up to three different types of electron detectors, such as ED-X, CCD, and BSE detectors. This multi-modal imaging capability makes S-4700 a valuable tool for sophisticated research in materials science, biology, and other fields. The FE-SEM technology is powered by a direct-alignment gun with high brightness and long-life, adjustable for optimal acceleration and beam resolution. This provides superior image clarity and stability, with a wide range of adjustable imaging conditions. S 4700 also features a unique in-lens detector for measuring electron backscatter and secondary electrons at non-optimal acceleration voltages. In terms of sample preparation for HITACHI S-4700, the system can accommodate samples without any special coating and can operate without liquid nitrogen. This makes it ideal for a wide variety of samples, which require minimal sample preparation. HITACHI S 4700 is an all-in-one SEM unit, with a compact size and light weight. This allows for easy installation and portability in various lab environments, while still providing advanced imaging capabilities. In summary, S-4700 FE-SEM machine is an ideal tool for imaging and elemental analysis of nanoscale samples. It is designed to be easy to use and requires minimal sample preparation. It offers superior image quality, a wide range of adjustable imaging conditions, and the ability to observe dynamic processes. It is light, easily portable, and has a long-lasting direct-alignment gun.
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