Used HITACHI S-4700 #9159242 for sale

HITACHI S-4700 is a scanning electron microscope (SEM) used for a variety of purpose. Equipped with a robust gun lens design and powerful analytical capabilities, this microscope is well suited for a wide range of tasks, from basic imaging and analytical measurements to complex experiments. The microscope's column consists of two main components: the electron detector and the objective lens. In the electron detector, electrons interact with a phosphor screen to produce a visible image. The objective lens focuses and deflects the beam of electrons which, when hitting the sample placed on the stage, generate a signal. To enable the microscope to provide fine resolution images, the objective lens is constructed using top quality materials. In addition, its double-tapering design provides a strong focus field, ensuring high performance imaging. This, coupled with the focus control unit and the geometric alignment flexibility, gives the microscope excellent performance even when imaging thin lamellae or curved samples. In addition, HITACHI S 4700 is capable of elemental analysis and conducting a range of experiments. This is enabled due to its high-speed, multiple-beam arrangement and the ability to select the optimum current, using the turret that provides multiple electron energies. S-4700 is also well suited to quantitative analysis experiments such as mapping of surface concentration and crystallographical orientation. Its Autoprobe Dual Focusing System allows for fine control of the electron beam and allows for high acquisition speed. Further, S 4700 is suitable for advanced surface characterization due to its field emission scanning electron microscopy. This involves the electron gun being optimized for field emission which, coupled with special accelerating grids, provides an efficient source of high-energy electrons that can be used for fine vector analysis. In short, HITACHI S-4700 is a powerful scanning electron microscope that combines a robust gun lens design, advanced imaging capabilities, multiple beam arrangement and surface characterization. Its ability to produce high-resolution images make it suitable for a variety of purposes including imaging, elemental analysis, quantitative analysis, surface characterization and vector analysis.