Used HITACHI S-4700 #9192126 for sale

HITACHI S-4700 scanning electron microscope (SEM) is an advanced imaging and analytical instrument used for observing nanostructures, characterizing materials and measuring properties of objects at the microscopic level. HITACHI S 4700 features a direct-drive vector scan, enabling true XY maps and measurements. It also offers an automated low vacuum (LV) equipment with a minimum pressure of 1 x 10-3 torr. The instrument includes a cold cathode ion source which provides localized analysis of samples and elemental maps. S-4700 boasts an ultra-high resolution FPM-5000 12-bit resolution camera with a large 5.7" video screen. This provides high-speed image capture that allows for a range of imaging techniques, including 3D, backscattering imaging and color-coded maps. S 4700's beam energy is adjustable between 0.1 and 30kV and can be controlled using the coil and condenser lens system, ensuring that only electrons of the optimal energy fall onto the sample. The unit also has low drift control and auto-contrast enhancement functions, improving the accuracy and resolution of the images. HITACHI S-4700 includes a CDD-1100 detector for high-resolution secondary electron images, as well as a SDD-1K00 low-voltage detector for precise low-energy imaging. It is equipped with a high-intensity X-ray sample-stage, which enables detailed microanalysis. HITACHI S 4700 can be operated in a variety of modes, such as spot mode, continuous scan mode, alpha mode and stepped scan mode. It is also equipped with an automated small specimen stage for spot-measurement and a sample-insructor for mounting substrates, enabling users to mount samples quickly and easily. S-4700 provides users with a wide range of signal processing capabilities to enhance images and broaden the range of analytical functions available. It is equipped with a primary electron SEM machine which offers real-time 3D imaging, particle analysis and mapping. In conclusion, S 4700 Scanning Electron Microscope is a powerful and versatile imaging and analytical instrument, designed for applications in a range of industrial, scientific and educational fields. It combines advanced imaging capabilities, precise measurements and a range of sophisticated signal processing functions in one affordable package.