Used HITACHI S-4700 #9204824 for sale
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ID: 9204824
Wafer Size: 8"
Vintage: 2000
Scanning Electron Microscope (SEM), 8"
2000 vintage.
HITACHI S-4700 is a scanning electron microscope (SEM) that offers high resolution imaging with nanometer level accuracy. The microscope utilizes a range of electron optics and technologies to provide unparalleled magnified images. HITACHI S 4700 utilizes a wide range of electron optics to magnify the sample being studied. This includes a cold field emission gun set-up which can be used to generate an electron beam and penetrate even the smallest sample. The gun also has a removable cathode which allows easy sample exchange. The SEM utilizes an advanced magnetic quadrupole objective lens system to ensure optimal and accurate imaging of the samples. This lens system is a combination of four electromagnetic coils and works by focusing the beam emitted from the gun onto the sample. The lenses produce nanometer level resolutions and can accurately image features down to a few nanometers. S-4700 also features a range of detectors which are used to detect electrons emanating from the sample. These detectors measure the signal strength and energy level of the electron and allow the user to image samples with different levels of contrast. One of the detectors is a secondary electron detector which can detect electrons as small as 5 nm and offer a range of signal enhancements. S 4700 also has a high vacuum chamber which helps provide a stable work environment, protecting samples from environmental influences. This chamber allows an increased level of air tightness and precision, ensuring that the sample is not damaged or interfered with. Lastly, HITACHI S-4700 utilizes a powerful software package to improve the scope of information that can be collected from the sample. This includes functions such as 3D reconstructions, stereo imaging and image analysis. The software also offers users the ability to save images, allowing for easy retrieval and review. HITACHI S 4700 Scanning Electron Microscope is a versatile and powerful instrument which allows for high resolution imaging, accurate sample observation and enhanced signal collection. Its advanced electron optics and detectors provide greater resolution and accuracy, with nanometer level resolution and excellent signal strength. Coupled with its powerful software package, S-4700 is a great tool for any research laboratory.
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