Used HITACHI S-4700 #9204827 for sale
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ID: 9204827
Wafer Size: 8"
Vintage: 1999
Field Emission Scanning Electron Microscope (FE-SEM), 8"
Main unit:
Fe tip: HITACHI FE Tip (Vext 4.2)
(4) Barion ion pumps
Oil pump: BOC EDWARDS STP 301H
Stage: Type 2 (5 Axes motor)
(2) SE Detectors
Ion pump power: HITACHI Electron
Trackball: Joy stick
Display unit:
Monitor: LCD
HP Compaq computer: HP Z220
Control panel: HITACHI Image control panel
Keyboard: HP English
Operating system: Windows XP
Accessories:
(2) Rotary pumps
Down trans: Auto transformer (Type: KT-3100)
Capacity: 7.5 kVA
(2) Pumping hose types
Baking tool
Gun align tool
Sample holder
1999 vintage.
TheHitachi HITACHI S-4700 is a scanning electron microscope (SEM) that is able to produce incredibly detailed images at the nanometer scale. This microscope can be used to obtain high-resolution images of a wide range of samples, including biological and industrial samples. HITACHI S 4700 features a large working distance, making it suitable for imaging large samples. The accelerated voltage for the electron beam is adjustable from 500-30,000 volts, allowing for imaging of even the smallest samples such as individual atoms. S-4700 also includes a magnified view of up to 800,000X, allowing for high-resolution imaging of a wide range of sample types. With the integrated energy dispersive X-ray (EDX) detectors, S 4700 can differentiate between different elements, giving researchers valuable elemental distribution maps. HITACHI S-4700 is widely used for a variety of applications including materials science, semiconductor failure analysis, life science, corrosion and environmental research, and industrial process diagnostics. The microscope is able to produce extremely detailed images and is an ideal tool for nanoscience and nanotechnology research. HITACHI S 4700 uses a highly sensitive secondary electron detector to register secondary electrons when the primary electron beam is impinged on the sample. This allows for imaging of large areas with faster speeds and improved sensitivity. S-4700 also features a range of automated functions that streamline the SEM imaging process. These features include automatic indexing of parameters, automatic generation of contrast maps, automated sample positioning and automatic measurement of features. Finally, S 4700 includes a variety of software packages that allow for easy imaging and data analysis. These include software packages for SEM imaging, digital image distribution, X-ray line scan data analysis, 3D mapping and tomography, and EDS spectrum analysis. Overall, HITACHI S-4700 is an excellent scanning electron microscope for a wide range of research applications. Its wide working distance, adjustable beam voltage, powerful magnified view, automated imaging functions, and powerful software make it an ideal imaging tool for life science and materials science research.
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