Used HITACHI S-4700 #9213753 for sale

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ID: 9213753
Scanning electron microscope (SEM) With OXFORD EDX Operating system: Windows NT 4.0.
HITACHI S-4700 is an advanced scanning electron microscope (SEM) renowned for its reliability and precision. It is designed with advanced imaging capabilities for a variety of academic, industrial and research applications. HITACHI S 4700 is capable of high-resolution images with a magnification range of up to 100,000 times, making it suitable for viewing the minutest of details. The microscope has an energy dispersive x-ray spectrometer, which allows for elemental analysis on the sample being viewed. This is especially helpful when exploring the molecular-level properties of materials. S-4700 also features a high-resolution camera that is capable of capturing high-resolution images at low and high magnifications, as well as in both SE (secondary electron) and BE (backscattered electron) modes. The BE mode provides valuable information on the sample's topographical features and also allows for easy viewing of crystalline and other structural features, such as grains and phases. S 4700 is equipped with a micromanipulator system, which enables accurate positioning of the sample, essential for optimum imaging and analysis. Additionally, the automated stage allows for the easy and quick movement of the sample to the designated position for imaging, with a maximum sample height adjustable up to 120mm. For sample preparation, HITACHI S-4700 is ready for both low and high vacuum operations, depending on the sample. A variety of sputter, lift and ion beam etching accessories are available for all common sample preparation techniques. The microscope has limited automated image analysis abilities; however, it can be easily connected to a desktop or laptop computer for further data analysis and report generation. This allows for easier manipulation and management of data collected from the microscope's imaging and scanning operations. HITACHI S 4700 is an efficient and reliable SEM created for imaging and analysis of microscopic sample structures. Its advanced features, such as a high-resolution camera, energy dispersive x-ray spectrometer and micromanipulator system, make it suitable for a variety of applications.
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