Used HITACHI S-4700 #9245498 for sale

HITACHI S-4700 Scanning Electron Microscope (SEM) is a high-performance model of electron microscope capable of examining the mass and surface of specimens at the nanometer scale. As one of HITACHI top-of-the-range models of SEM, HITACHI S 4700 offers a variety of features and functions to researchers, producers and manufacturers who require a high-resolution, high-performing microscope for their projects. The instrument offers a variety of image capturing technologies, most notably its secondary electron (SE) imaging mode which offers particles, clusters of particles and fibers at the nanometer scale. This feature is aided by the SNMS (Secondary Neutral Mass Spectrometry) technology, allowing for the generation of chemical information from almost any specimen. The SEM mode (High Angle Annular Dark Field SEM) allows for analysis of objects possessing nanometer-scale transverse resolutions at low accelerating voltages and high detection efficiency which is aided by its ultra-high voltage detector. In addition, S-4700 allows a wide range of elements to be analyzed through its EDX (Energy Dispersive X-ray Analysis) capability. Combining this with its custom designed X-ray detector helps to generate accurate data and enhanced efficiency in specimen examination. S 4700 also offers a wide selection of automated functions to streamline specimen workflow such as automated film size recognition, stage wander prevention and Z-shift compensation. Furthermore, with its array of advanced hardware, software and imaging equipment capabilities, HITACHI S-4700 allows researchers to analyze virtually any surface or sample. In addition, the model has its own built-in sample preparation system; a feature which aids with the preparation of the specimen for imaging. Other sample preparation features include a holder for liquid nitrogen for cryo-SEM and a wet specimen cell for liquid specimens to obtain pre-frozen images. Combined with these unique features, the model has an intuitive control unit and touchscreen which allow users to easily and intuitively operate the unit. In addition, HITACHI S 4700 incorporates a novel X-Y navigation machine which integrates both 2D and 3D navigation in one unit. This adds to the model's flexibility, allowing users to use the same SEM for either 2D or 3D imaging jobs. Overall, S-4700 offers a variety of innovative solutions to users and is an industry leader in scanning electron microscopy. Its ability to combine speed, accuracy and precision makes it an invaluable tool for materials science, quality control and laboratory work. With its ease of use and its advanced imaging capabilities combined with its versatile scanning modes, S 4700 is the perfect tool for projects requiring a high-performance SEM.