Used HITACHI S-4700 #9269385 for sale

HITACHI S-4700 is a high performance scanning electron microscope (SEM) designed to provide superior imaging performance with ultimate flexibility. It uses an innovative field emission electron gun (FEG) making it well suited for a wide variety of imaging techniques, including EDS and EBSD analysis. With its high resolution capabilities, HITACHI S 4700 allows for detailed analysis of tiny specimens and surface morphological properties. S-4700 is equipped with a fully automated image stitching system, allowing for larger fields of view without sacrificing image resolutions. This is achieved by employing overlay stage functions, providing accurate and precise virtual stitching. S 4700 also boasts a high speed scan/zoom function, allowing users to go from a wide field of view to high resolution imaging in seconds. HITACHI S-4700 is compatible with a variety of sample preparation tools and accessories, such as ion beam polishing, ion accelerator processing, extended depths of field, and cryo-preparation. HITACHI S 4700 also features an optional available sample holder which can be used to support a wide range of sample shapes and sizes. Furthermore, S-4700 allows for full control over the electron beam, allowing for fine tuning of parameters such as color, contrast, brightness and color balance. The built-in beam blanker reduces sample damage due to irradiation by cutting off excess electrons. The built-in image enhancement algorithms improves image fidelity without loss of original information. The mechanical design of S 4700 is made for ultimate stability and reliability. It utilizes a load lock system to reduce or eliminate gas contamination. The high tension power supplies have full range adjustable operations, providing optimal performance for each sample. HITACHI S-4700 has a user friendly interface, with software control over all SEM parameters, including 'touch rock-and-roll' magnification, current range control, brightness/contrast calibrations, and image arithmetic functions. HITACHI S 4700 also offers a variety of imaging/analysis options, including auto-count and line-scan functions, through-focus imaging, and extended depth-of-field scanning. Overall, S-4700 offers a wealth of versatile imaging capabilities and advanced software control. This sophisticated SEM allows for exceptional imaging detail and unsurpassed levels of sample preparation, making it an ideal solution for research and industry applications.