Used HITACHI S-4700 #9276154 for sale

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ID: 9276154
Field Emission Scanning Electron Microscope (FE-SEM) Includes: Magnification: 500,000 times and resolve features to 2 nanometers Accelerating voltage range: From 0.5 keV to 30 keV 2.5 nm resolution at 1 kV 1.5 nm resolution at 15 kV Magnification range: From 30x to 500,000x PC-controlled five axis motorized stage Specimen stage rotation 360° in continuous mode Specimen tilt at 12mm working distance (WD) up to 45" Sample size up to 100 mm diameter x 17 mm high (2) Secondary Electron (SE) detectors: Above and below objective lens Digital image acquisition: 640 x 480, 1280 x 960, or 1560 x 1920 pixels Fully digital imaging Image processing Archiving system.
HITACHI S-4700 scanning electron microscope (SEM) is an advanced electron microscopy instrument designed for high-resolution imaging of a wide range of materials. The design of this SEM offers many advantages including flexibility and improved imaging resolution, along with an ergonomic operating environment for sample manipulation. Due to its "variable pressure" mechanism, HITACHI S 4700 achieves remarkable performance regardless of sample characteristics. S-4700 is a desktop SEM with a high-voltage power supply capable of operating up to 30 kV, enabling users to change the voltage and imaging conditions as needed. This feature, along with its high-sensitivity signal levels, allows for observation of sample details at optimal resolution. Additionally, an automatic focus adjustment system ensures that the image is always in focus. S 4700 is integrated with the E-LINK software, which provides easy control of the SEM and its components for simple instrument optimization, data capture and quantitative analysis. A variety of objective lenses provide a range of magnifications, from 20x to several thousand times. The imaging system also offers variable-length field lenses for optimal imaging and flexibility of resolution. The 360° rotating sample holder provide unparalleled sample manipulation and examination from any angle, making it ideal for analyzing irregularly shaped objects. To ensure quality imaging, a variety of stage and specimen holders are available to securely keep samples in place. HITACHI S-4700 features a vacuum system composed of a primary turbomolecular pump and a secondary diaphragm pump, enabling the rapid evacuation of residual gases that are essential for improved image quality. In addition, the secondary pump also helps to reduce sample charging. HITACHI S 4700 is an ideal SEM for a wide range of applications, including industrial, academic and research settings. Its innovative imaging technology and user-friendly design make it a powerful tool for any microscopy application.
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