Used HITACHI S-4700 #9284210 for sale

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ID: 9284210
Vintage: 1997
Scanning Electron Microscope (SEM) 1997 vintage.
HITACHI S-4700 is a high-performance scanning electron microscope (SEM) designed to provide superior image resolution across a wide range of sample types and geometries. At the heart of HITACHI S 4700 is an electron gun with a unique horizontal filament assembly, which allows the operator to provide a powerful uniform electron beam. The high-energy electron beams provides bright images with excellent depth resolution, enabling analysis of individual nanostructures and microstructures as well as wide-area analysis of larger samples. S-4700 also offers superior resolution over other SEMs thanks to its high optical resolution. This is made possible by the advanced objective lenses and secondary electron detectors, providing images with a resolution of less than three nanometers. S 4700 also offers automated in-situ scanning, allowing the operator to rapidly scan large areas in three dimensions. HITACHI S-4700 features optimized workflows and intuitive user interfaces, as well as automated functions such as automated focus and stigmate, providing an overall streamlined operation. The microscope also offers a wide range of imaging modes, including augmentive field emission scanning, auger and x-ray energy dispersive spectroscopy, backscatter electron imaging, bright field and dark field imaging, cathodoluminescence and ultra-high-vacuum imaging. In conclusion, HITACHI S 4700 is a powerful and sophisticated scanning electron microscope capable of analyzing a wide range of sample types and geometries. The advanced electron gun and optical resolution of S-4700 provides superior image resolution, and the automated in-situ scanning and user-friendly interface allows for quick and easy operation. The addition of a wide range of imaging modes further enhances the flexibility of S 4700, making it an ideal choice for materials science and semiconductor failure analysis.
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