Used HITACHI S-4700 #9315416 for sale

HITACHI S-4700 scanning electron microscope (SEM) is a highly advanced imaging equipment designed for a variety of applications. This high-precision microscope is capable of producing detailed images of specimens at high magnification levels, providing unique insight into the internal and external structures of the sample material. HITACHI S 4700 features several advanced capabilities that make it an attractive option for a wide range of research and industrial applications. This microscopy system features a high-resolution imaging unit, allowing users to achieve unsurpassed magnification levels of up to 1,000,000×. This impressive level of magnification is made possible through the use of a beam-scanning machine and a highly sensitive detection tool. Both systems help to capture the fine details of specimens and make them visible through high quality imaging. S-4700 also features an advanced electron optics and mechanical imaging asset that allows users to obtain images of high contrast and sharp resolution. This is accomplished through utilizing several optical components, such as spatial filters, centering and illumination lenses, and an aperture. All of these components increase the level of detail that can be achieved, allowing for the precise and accurate imaging of delicate materials. The SEM model further features ultra fine sample surface imaging capability through the use of the variable pressure equipment. This unique design allows users to reduce the instability of the sample surface by manipulating the pressure in the chamber surrounding the sample. This feature helps users experimenting with different material and surface types, granting them the ability to better study surface characteristics such as surface topography and morphology. HITACHI produces several viewing and analysis systems for S 4700, providing researchers with options for displaying and manipulating images for various methods of study.Comes equipped with simultaneous imaging and plotting capabilities, allowing users to display multiple images and analyze them with a variety of tools, such as mutli-mode imaging, zooming, panning, and 3D rendering tools. Additionally, compatible software packages can be integrated for the production of specialist image display functions, such as analytical data or graphical simulations. Finally, HITACHI S-4700 is compatible with several automated stage systems that provide precise sample positioning and movement. This feature saves time by automatically navigating individual samples, thus making the imaging process easier to complete in a timely manner. Overall, HITACHI S 4700 scanning electron microscope is an advanced imaging system that is ideal for a wide range of research and industrial applications. Featuring impressive magnification levels, precise imaging, specialized analysis capabilities, and automated stage functions, this unit is capable of producing accurate results with the utmost accuracy and precision.