Used HITACHI S-4700 #9382978 for sale

HITACHI S-4700 is a scanning electron microscope (SEM) designed to operate in both low and high vacuum modes. The SEM is suited for a wide range of applications such as surface imaging, elemental analysis, and sample manipulation. HITACHI S 4700 is equipped with an energy dispersive spectrometer (EDS) for sample analysis that offers both elemental mapping and quantification capabilities. The EDS is also capable of acquiring a wide range of element types and delivers high resolution analyses. In addition, S-4700 comes with a Secondary Electron Detector (SED) which is suitably responsive, highly sensitive and able to record imaging signals with faithful representation. S 4700 has a large chamber size to ensure maximum convenience during sample loading and observation even with large samples. The SEM's chamber is temperature controlled and the built-in temperature sensors can detect any fluctuations in temperature to ensure optimum stability. HITACHI S-4700 is easy to operate and makes use of an intuitive onboard user interface. This interface enables the user to control and set up parameters for SEM imaging and EDS analysis, including detector gain, beam current and exposure time. The SEM also has an automated auto-tune feature which sets the correct parameters and conditions for imaging, ensuring optimal performance. HITACHI S 4700 offers sophisticated scanning capabilities. Features such as a power-stabilizing mount enable the user to adjust the acceleration voltage to image the sample with a range of possible magnifications and resolutions. In addition, S-4700 offers a broad range of specimen handling options such as vacuum coating, sample staging and in-situ sample analysis. Overall, S 4700 is a powerful and versatile scanning electron microscope with an array of features and capabilities. Its built-in features and automated systems make it an ideal choice for a wide range of SEM applications in both research and industrial settings.