Used HITACHI S-4700 #9388400 for sale

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ID: 9388400
Field Emission Scanning Electron Microscope (FE-SEM).
HITACHI S-4700 is a scanning electron microscope (SEM) that provides high resolution imaging of specimen surfaces with powerful analytical capabilities for many research and industrial applications. HITACHI S 4700 features a secondary electron detector with a digital signal amplifier, a three-dimensional (3D) stage, electromagnetic lenses, and a charge-coupled device (CCD) camera for imaging. The secondary electron detector allows for high-resolution imaging at low beam currents, making it ideal for imaging small-scale samples and obtaining high-contrast images without sample damage. The digital signal amplifier allows for signal processing and signal-to-noise enhancement. The 3D stage allows the specimen to be tilted and rotated in a cost-effective manner to obtain improved imaging and surface analysis. The electromagnetic lenses offer superior image quality and resolution, while the multi-source filament allows for simultaneous imaging in multiple directions. The CCD camera provides excellent color reproduction, as well as live video monitoring of the specimen under observation. S-4700 is capable of capturing images with a maximum resolution of 4 nm and 60,000X magnification. In addition to its imaging capabilities, S 4700 also offers several analytical features such as wavelength-dispersive X-ray spectroscopy (WDXS), electron backscatter diffraction (EBSD), and energy-dispersive X-ray spectroscopy (EDXS). WDXS provides elemental analysis with high spatial resolution, allowing for direct imaging of alloy composition and micro-chemical mapping. EBSD offers sub-micron resolution analysis of crystalline phases in materials, which can be used to identify minerals and characterize grain boundaries in polycrystalline materials. EDXS provides micro-scale elemental analysis that is indispensable for materials characterization and failure analysis. HITACHI S-4700 offers powerful capabilities for imaging, analysis, and characterization of specimen surfaces. Its combination of high resolution imaging and powerful analytical capabilities make HITACHI S 4700 an ideal choice for many research and industrial applications.
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