Used HITACHI S-4700 #9388400 for sale
It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.
Tap to zoom
Sold
HITACHI S-4700 is a scanning electron microscope (SEM) that provides high resolution imaging of specimen surfaces with powerful analytical capabilities for many research and industrial applications. HITACHI S 4700 features a secondary electron detector with a digital signal amplifier, a three-dimensional (3D) stage, electromagnetic lenses, and a charge-coupled device (CCD) camera for imaging. The secondary electron detector allows for high-resolution imaging at low beam currents, making it ideal for imaging small-scale samples and obtaining high-contrast images without sample damage. The digital signal amplifier allows for signal processing and signal-to-noise enhancement. The 3D stage allows the specimen to be tilted and rotated in a cost-effective manner to obtain improved imaging and surface analysis. The electromagnetic lenses offer superior image quality and resolution, while the multi-source filament allows for simultaneous imaging in multiple directions. The CCD camera provides excellent color reproduction, as well as live video monitoring of the specimen under observation. S-4700 is capable of capturing images with a maximum resolution of 4 nm and 60,000X magnification. In addition to its imaging capabilities, S 4700 also offers several analytical features such as wavelength-dispersive X-ray spectroscopy (WDXS), electron backscatter diffraction (EBSD), and energy-dispersive X-ray spectroscopy (EDXS). WDXS provides elemental analysis with high spatial resolution, allowing for direct imaging of alloy composition and micro-chemical mapping. EBSD offers sub-micron resolution analysis of crystalline phases in materials, which can be used to identify minerals and characterize grain boundaries in polycrystalline materials. EDXS provides micro-scale elemental analysis that is indispensable for materials characterization and failure analysis. HITACHI S-4700 offers powerful capabilities for imaging, analysis, and characterization of specimen surfaces. Its combination of high resolution imaging and powerful analytical capabilities make HITACHI S 4700 an ideal choice for many research and industrial applications.
There are no reviews yet