Used HITACHI S-4700 #9401458 for sale

HITACHI S-4700 is an advanced scanning electron microscope (SEM) that offers a range of features to meet the requirements of advanced research and industrial applications. The equipment is equipped with a high-resolution field emission gun (FEG) electron source and a large working distance objective lens for improved imaging. The FEG System is capable of generating brighter and sharper images, in a variety of resolutions from subnanometer level to greater than 8nm. The imaging capabilities of HITACHI S 4700 are best suited for applications involving the study of small particles and biological specimens. The secondary electrons generated by the impact of the high voltage electron beam on the sample surface can reveal topographical information with subnanometer resolution. The unit can also be used for surface analysis applications, such as the measurement of surface area, grain size, and elemental composition. If integrated with an energy dispersive spectrometer, the machine can also perform high resolution elemental analysis. S-4700 is also designed to offer high speed imaging and high throughput operations. With the built-in high speed CCD camera, the microscope can acquire images faster than any other conventional SEM. Its large chamber and stage enable high throughput operations with large sample volumes. S 4700 provides flexibility in sample manipulation and observation. With the addition of the newly developed magnetic stage, the tool is capable of 360-degree rotational scanning of samples, allowing the user to obtain a greater range of images with fewer photographs. Furthermore, the large chamber accommodates multiple specimen manipulation techniques, such as tilting and stages with needle or microprobe manipulators. For advanced users, HITACHI S-4700 offers a wide range of user-friendly software and hardware options. HITACHI Automated Control Asset (HACS) is equipped for easy operation, enabling users to easily set up parameters for imaging and analyze their data. Additionally, the new software options, such as HITACHI Automated Image Analysis Model (HAIAS), provide powerful tools for users to process and analyze the images obtained from the SEM. In conclusion, HITACHI S 4700 is an advanced SEM that delivers exceptional imaging capabilities, high throughput operations and flexible sample manipulation. The combination of these features makes the equipment an ideal platform for advanced research and industrial applications, as well as for elemental analysis.