Used HITACHI S-4800 Type I #9270676 for sale

HITACHI S-4800 Type I is a scanning electron microscope (SEM) with dual microscopes, allowing for both standard and in-lens (low-voltage) imaging. This system is highly configured and includes an advanced wafer-stage, wide variety of detectors, column-achieving angle and tilt, and a generous range of detectors. The electron optical system of the S-4800 provides powerful versatility. The dual microscopes can be used to scan samples at a range of magnifications and accelerating voltages, and each microscope has an adjustable stage so that different samples can be inspected with ease. The wafer-stage allows for finer control over the tilt and rotation of the sample, while the in-lens detector enables visualization of surface features at low voltage. The S-4800 also has an array of detectors, including a SE-detector, BSE-detector, SE/BSE-detector and CL detector. The SE-detector is advanced and used for imaging samples at low energies, while the BSE-detector is best for imaging samples at higher energy distributions. The SE/BSE-detector is used to detect the subtle contrasts between electrons in both directions. The CL detector is ideal for elemental analysis, and is highly sensitive to the composition of a sample. The S-4800 is also equipped with a semi-automatic sample chamber which allows the user to select from a wide range of specimen options. The chamber has an optional side-loading chamber to allow examination of large specimens, and a choice of variable pressure sample holders for special samples. Samples can also be adjusted for automated navigation and alignment, making it easier to locate them on the wafer-stage. In addition, the S-4800 features a multi-tasking image processing software. This program was designed to analyze complicated 3D images and produce precise quantitative information, while accurately reproducing sample features in multiple channels. The S-4800 provides a convenient, user-friendly environment for specimen examination and analysis. In conclusion, S-4800 Type I is a powerful and versatile scanning electron microscope, with a dual microscope configuration and a wealth of advanced imaging and analysis options. It is the clear choice for researchers seeking to extract precise information from their samples with the finest level of detail and accuracy.