Used HITACHI S-4800 Type II #9223407 for sale
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ID: 9223407
Vintage: 2005
Field Emission Scanning Electron Microscope (FE-SEM)
Resolution:
Accelerating voltage: 15 kV
Working distance: 4 mm to 1.0 nm
Accelerating voltage: 1 kV
Working distance: 1.5 mm to 2.0 nm
Magnification:
High magnification mode: 100x to 800000x
Low magnification mode: 30x to 2000x
Electron optics:
Electron gun: Cold cathode field emission type
Extracting voltage: 0 to 6.5 kV
Accelerating voltage: 0.5 to 30 kV (100 V Steps)
Lens: 3-Stage electromagnetic lens, reduction type
Objective lens aperture:
Movable aperture: 4 Openings selectable / Alignable outside column
Self-cleaning thin aperture
Electromagnetic astigmatism correction coil
Scanning coil: 2-Stages electromagnetic deflection type
Specimen stage:
X-Traverse: 0 to 110 mm
Y-Traverse: 0 to 110 mm
Z-Traverse: 1.5 to 40.0 mm
Tilt: -5° to 70°
Rotation: 360°
Specimen size: 6" (Airlock type)
Display unit:
Display type: Flicker free image on PC monitor
Viewing monitor: LCD, 18.1"
Type 21 color CRT (1280 x 1024 Pixels)
Photo CRT: Ultra-high resolution type
Effective field of view: 120 x 90 mm
Scanning modes:
Normal scan
Reduced area scan
Line scan
Spot analysis
Average concentration analysis
Split / Dual magnification
Scanning speeds:
TV:
640 x 480 Pixels display: 25 / 30 flames/s
NTSC / PAL Signal
Fast: Full screen display: 25 / 30 flames/s
Slow:
Full screen display: 1/0.9, 4/3.3, 20/16, 40/32, 80/64 s/flame
640 480 Pixels display: 0.5/0.4, 2/1.7, 10/8, 20/16, 40/32 s/flame
Photograph:
2560 x 1920 Pixels display: 40/32, 80/64, 160/128, 320/256 s/flame
Value of (50 Hz) / (60 Hz)
Signal processing modes:
Automatic brightness control
Gamma control
Automatic focus
Automatic stigmator
Automatic data display:
Image number
Accelerating voltage
Magnification
Micron bar
Micron value
Date/time
Working distance
Electrical image shift: ±12 um
Evacuation system:
Type: Fully automatic pneumatic-valve system
Vacuum levels:
Specimen chamber: 7 x 10-4 Pa
Electron gun chamber:
IP-1:1 x 10-7 Pa
IP-2: 2 x 10-6 Pa
IP-3: 7 x 10-5 Pa
Vacuum pumps:
Electron optical system: (3) Ion pumps
Specimen chamber: Turbo molecular pump
Oil rotary pump
Compressor: Oil-less type
Warning devices:
Power failure
Cooling-water interruption
Inadequate vacuum
2005 vintage.
HITACHI S-4800 Type II is an advanced scanning electron microscope (SEM) designed to provide high-resolution images of various samples. It is a versatile instrument that can be used for a wide range of applications such as failure analysis, studying surface microstructures, and performing sample imaging and analysis. HITACHI S 4800 TYPE II utilizes secondary electron detector technology to produce high-resolution images of samples with high contrast and detail. The imaging system features a field emission gun (FEG) column, which provides an electron beam with a very high brightness and a very low emittance that enable improved image resolution and excellent depth of focus. S-4800 Type II offers a variety of detection modes such as backscattered electron (BSE) imaging, X-ray crystal analysis, voltage contrast imaging, and beam deceleration imaging. The potential resolution from the FEG column is 0.5nm, and the maximum acceleration voltage of the electron beam is 30 kV. The SEM also comes with a high-throughput automated stage, which can accommodate up to 30 specimen holders. This allows specimens to be quickly moved throughout the viewing area for efficient SEM operation. In addition, S 4800 TYPE II also offers an advanced analytical package allowing users to perform real-time elemental analysis and quantitative imaging. This system includes a cold cathode ion-mass spectrometer (CCIMS), which can simultaneously measure and map up to five different elements. Also, the device is equipped with a digital image processing system, which enables a variety of image transformations such as size and shape measurements, area fraction analysis, and Z-map image reconstruction. Overall, HITACHI S-4800 Type II is a powerful scanning electron microscope designed to cater to the needs of researchers and engineers who require high-quality images and enhanced analytical capabilities. It features an improved FEG column, various imaging modes, and an advanced analytical package for real-time analysis of samples. With such a wide array of features, HITACHI S 4800 TYPE II is an ideal tool for exploring the microstructures of various materials.
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