Used HITACHI S-4800 Type II #9309410 for sale

HITACHI S-4800 Type II scanning electron microscope (SEM) is an advanced imaging tool designed for routine and specialized imaging applications. This SEM features secondary and backscattered electron detectors and an X-Y stage with a maximum sample size of 108 mm. It is equipped with an EverReady PC and Windows-based software for optimal control of the microscope. HITACHI S 4800 TYPE II SEM is capable of imaging samples with the highest resolution possible for samples in its size range. This is achieved using an energy-dispersive X-ray analyzer (EDX) which measures emitted X-rays using an energy filter, enabling it to perform elemental analysis and rapid spatial resolution imaging with the highest spatial resolution of 30 nanometers.It is equipped with a built-in motorized system which enables it to image specimens with high-resolution and low noise. In addition to its X-Y stage, S-4800 Type II SEM features two additional stages - a rotational stage and a tilt stage. These stages are used to rotate and tilt the sample during imaging. The tilt range of the tilt stage is ±20°, giving ample flexibility in sample orientation. S 4800 TYPE II SEM is also equipped with a software package that enables sound operation and analysis in different modes. The software allows for enhanced imaging by incorporating various imaging parameters such as brightness and contrast, as well as providing control for the secondary and backscattered electron detectors. The software also provides support for mapping and analysis in multi-monitor mode. In order to power HITACHI S-4800 Type II SEM, it requires an AC outlet voltage of 220V. The system is also equipped with a vacuum system generator, which ensures that the vacuum is maintained at a constant level, thus enabling high quality imaging. The maximum vacuum level that can be achieved is 5 x 10-10 Torr. HITACHI S 4800 TYPE II SEM is a powerful imaging tool that can assist in various research and development projects. Its capabilities include imaging and elemental analysis of specimens, as well as specialised imaging modes and software for multi-monitor mapping and analysis. It provides excellent resolution and reliable operation in all vacuum conditions necessary for optimal operation.