Used HITACHI S-4800 Type II #9311798 for sale
URL successfully copied!
ID: 9311798
Vintage: 2004
Field Emission Scanning Electron Microscope (FE-SEM)
FE Tip
(4) Barium Ion pumps
BOC EDWARDS STP 301H Pump
Stage: Type 2
5 Axis motor, 6"
SE Detector:
Upper detector
(2) Lower detectors
Ion pump power: HITACHI Electron
Option: CD Measurement function
Display unit:
LED Monitor, 19"
AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT D530 CMT Control PC
Stage move: Joy stick control
Control panel
AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 101 Keyboard
Microsoft mouse
Operating system: Window XP
Utility:
EDWARD ESDP13 Pump
Pumping hose type
Chiller
Down trans:
4F500-548 Auto transformer
Capacity: 7 kVa
Resolution:
Accelerating voltage: 15 kV
Working distance: 4 mm to 1.0 nm
Accelerating voltage: 1 kV
Working distance: 1.5 mm to 2.0 nm
Magnification:
High magnification mode: 100x to 800,000x
Low magnification mode: 30x to 2,000x
Electron optics:
Electron gun: Cold cathode field emission type
Extracting voltage (Vext): 0 to 6.5 kV
Accelerating voltage (Vacc): 0.5 to 30kV (100 V Steps)
Lens: 3-Stage electromagnetic lens, reduction type
Objective lens aperture:
Movable aperture (4 openings selectable / Alignable outside column)
Self-cleaning thin aperture
Astigmatism correction coil: Electromagnetic type (stigmator)
Scanning coil: 2-Stages electromagnetic-deflection type
Specimen stage:
X Traverse: 0 to 110 mm (continuous)
Y Traverse: 0 to 110 mm (continuous)
Z Traverse: 1.5 to 40.0 mm (continuous)
Tilt: -5° to +70°
Rotation: 360°
Specimen size: Maximum 100 mm diameter
Display unit:
Display type: Flicker-free image on PC monitor (Full scanning speeds)
Viewing monitor: Type 18.1 LCD
Option: Type 21 color CRT (1280x1024 Pixels)
Photo CRT (Option): Ultra-high resolution type
(Effective field of view 120x90 mm)
Scanning modes:
Normal scan
Reduced area scan
Line scan
Spot analysis
Average concentration analysis
Split / Dual magnification
Scanning speeds:
Fast: Full screen display: 6.25/7.5 Frames/s
TV: 640 x 480 pixel display: 25/30 Frames/s
NTSC or PAL Signal
Slow:
Full screen display: 1/0.9 , 4/3.3 , 20/16, 40/32 ,80/64 Frames/s
640x480 Pixels display: 0.5/0.4 , 2/1.7 , 10/8 , 20/16, 40/32 Frames/s
Photograph:
2560 x 1920 Pixels display: 40/32, 80/64, 160/128, 320/256 Flame/s
Value: 50/60 Hz
Signal processing modes:
Automatic brightness control
Gamma control
Automatic focus
Automatic stigmator
Automatic data display:
Image number
Accelerating voltage
Magnification
Micron bar
Micron value
Data/time and working
Distance can be printed in film
Data entry: Alphanumeric characters, number, and marks
Electrical image shift: 12 m (WD=8 mm)
Evacuation system:
Fully automatic pneumatic-valve system
Ultimate vacuum levels:
Specimen chamber: 7x Pa
Electron gun chamber:
IP1 1 x Pa or Better
IP2 2 x Pa or Better
IP3 7 x Pa or Better
Vacuum pumps:
Electron optical system: (3) Ion pumps
Specimen chamber: Turbo molecular pump
Oil rotary pump
(4) Compressors: Oil-less type
Warning devices:
Power failure
Cooling-water interruption
Inadequate vacuum
Power requirements: 100V AC (±10%), Single phase, 50/60Hz
4 kVA For voltage other than 100V AC
2004 vintage.
HITACHI S-4800 Type II is a scanning electron microscope (SEM) with high resolution imaging and analysis capabilities. It is a next generation SEM, with a wide range of features to improve both knowledge acquisition and processing. HITACHI S 4800 TYPE II has a large digital display, enhanced imaging capabilities, and a wide range of sample manipulation tools, making it a powerful tool for studying the structure and composition of materials. At the heart of S-4800 Type II is the STEM (Scanning Transmission Electron Microscope). This technology allows for a whole range of microstructural and elemental analysis. The advanced imaging technology used in S 4800 TYPE II gives a high-resolution, topographical map of the sample that can be scanned at a resolution as high as 1 nanometer. With this level of precision, it is possible to acquire atomic-scale images of samples, allowing for a detailed understanding of their properties and structure. HITACHI S-4800 Type II is also equipped with a range of sample manipulation tools. This incorporates a sample holder system with finely adjustable movement and scanning capabilities, as well as a sample stage that can be rotated for changing views. When used in combination with the STEM, these tools provide researchers with a range of tools for manipulating samples, enabling them to achieve their desired results. In addition to its high-resolution imaging capabilities, HITACHI S 4800 TYPE II also includes a range of intuitive software features. This includes a user-friendly graphical user interface (GUI) and an automation function that can be used to automate a range of procedures. This makes it easy to set up experiments quickly and accurately, as well as to track progress and analyze results. S-4800 Type II also makes use of a vacuum system to ensure clean samples are analysed with confidence. This helps to ensure that the sample stays in the optimal state for optimal imaging results. Overall, S 4800 TYPE II is a powerful tool for electron microscopy. With its advanced imaging and analysis capabilities, it is a reliable tool for materials research and analysis.
There are no reviews yet