Used HITACHI S-4800 Type II #9381462 for sale

HITACHI S-4800 Type II is a field emission scanning electron microscope developed and marketed by HITACHI High Technologies Corporation. This type of scanning electron microscope (SEM) is capable of producing well-defined, high-resolution images of the top surfaces of solid materials. It also captures secondary electrons generated from the sample by bombarding it with an electron beam. This is known as electron backscatter diffraction (EBSD) and is a key technique for characterization of the crystallographic structure of a material. HITACHI S 4800 TYPE II is equipped with an emission source with a small spot size, allowing for high nA/V current density and low accelerating voltage. Its combination of normal and low voltage operation provides high resolution imaging and EBSD at lower magnifications. The versatile operating range of 1.0 nm to 40 nm lets it create images with an impressive level of detail. S-4800 Type II offers several unique features, including its low-contrast image processing, automatic film-thickness correction, automatic electron beam calibration, and its crystallography analysis equipment. The low-contrast image processing is especially useful for obtaining clear images of low-contrast materials, while the automatic film-thickness correction accurately calculates the thickness of a specimen. The automatic electron beam calibration helps to improve performance, while the crystallography analysis system makes it easy to determine the crystallographic parameters from SEM images. In addition, S 4800 TYPE II is equipped with a high-sensitivity HDR camera, providing an improved method for investigating weakly-fluorescent samples. This makes it possible to create highly detailed images of specimens with weak signals, even at low magnifications. Furthermore, the low kV beam current lets the unit to better detect weak signals, thus reducing the number of noise artifacts that can be picked up in an image. Overall, HITACHI S-4800 Type II is a powerful, versatile scanning electron microscope with a brilliant optics machine that enables it to create detailed images and EBSD data from various materials. Its combination of high nA/V current density, low accelerating voltage, and low kV beam current lets it capture excellent images, while its numerous specialized features make it easy to analyze and interpret the data. As such, it is a great tool for materials scientists and engineers to better study the structures and compositions of solid materials.