Used HITACHI S-4800 Type II #9389453 for sale
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ID: 9389453
Wafer Size: 12"
Vintage: 2004
Field Emission Scanning Electron Microscope (FE-SEM), 12"
Secondary electron image resolution: 1.0 nm (15 kV, WD: 4 mm)
Deceleration mode: 1.4 nm (1 kV, WD: 1.5 mm)
Normal mode: 2.0 nm (1 kV, WD: 1.5 mm)
Magnification:
LM Mode: 20x ~ 2,000x
HM Mode: 100x ~ 800,000x
Specimen stage:
Stage motorization: 5-Axis motorized
Type II:
X: 0 mm - 110 mm
Y: 0 mm - 110 mm
Z: 1.5 mm - 40 mm
T: -5 mm - +70°C
R: 360°
Includes:
Keypad
Trackball
BSE
STEM
EDX
Chamber camera
Operating system: Windows XP
2004 vintage.
HITACHI S-4800 Type II is a scanning electron microscope (SEM) known for its excellent performance and resolution, and extreme versatility. It is a field emission type SEM, meaning it uses an electron gun which emits a small beam of electrons using a tungsten filament driven at high current. HITACHI S 4800 TYPE II is capable of operating in both low and high vacuum modes, allowing the imaging of uncoated samples. This capability makes it especially well suited for imaging organic and biological samples. It also has low voltage operation of 0.15 to 3.00 keV, extending the range of possible imaging targets. The SEM is equipped with a hybrid secondary electron detector, for capturing secondary electrons. These are the electrons which are created when the primary beam of electrons interacts with the surface of the sample. It can be operated for research and analysis of a wide range of samples from semiconductors to biomaterials. S-4800 Type II also offers variable shaped beam technology, or V-SEM. This enables the user to control the shape and size of the primary beam which improves resolution by up to 15 times when compared to typical SEMs. The V-SEM allows for greater flexibility in analysis and greater speed for certain kinds of imaging. It is equipped with both manual and automated stages, and is capable of automatic cell imaging using a newly developed sample cell movement controller. The controller can move the sample while the SEM is in operation, allowing for a much wider scope of automated sample images to be taken. S 4800 TYPE II is designed for optimized sample observation and preparation. It is equipped with an in-lens or environmental STEM detector, allowing it to provide unparalleled imaging of samples in both low and high vacuum modes. It is capable of detecting elements with an atomic number greater than 5. HITACHI S-4800 Type II is a highly versatile and capable SEM, designed for optimized research and analysis of a wide range of samples. Its variable shaped beam technology, low voltage operation, and in-lens and environmental STEM detectors make it ideal for the imaging of biological and organic samples.
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