Used HITACHI S-4800 #293596399 for sale

HITACHI S-4800 scanning electron microscope is one of the most advanced instruments available for use in materials science and life science research. It combines unprecedented levels of performance, flexibility, and precision with a great ease of use. This is a turbomolecular field emission scanning electron microscope (TFE-SEM) capable of high resolution imaging and spectroscopy of materials at the nanometer level. HITACHI S 4800's large 5kV ion source provides a powerful source of high energy electrons that can penetrate intricate structures and provides a larger field of view than most similar microscopes. The kinetic energy of the electrons can also be quickly varied which enables imaging and analytical surface information at different magnifications and resolutions. The ion source is coupled to a high performance electron optical column consisting of an accurate electrostatic focusing lens and an anomaly corrected condenser lens. These components produce an extremely stable and efficient beam of electrons to reach the nano-scale structures. In addition to the electron optics, S-4800 also features an automated sample stage with an efficient purpose-built sample handling device. This allows for rapid and precise sample mounting and positioning, allowing operators to obtain high quality images in a fraction of the time usually required. The stage also features a large range of motorized functions which can be used to determine sample structure at the nanoscale in a fully automated manner. For imaging, S 4800 utilizes several advanced detectors, ranging from a standard secondary electron detector to a backscattered electron and X-ray detector. This allows users to image different types of samples, such as metals, alloys, ceramics, and their constituents, using different types of imaging. It also provides the flexibility to analyze various surface and subsurface processes and to obtain detailed microstructural analyses of materials. In conclusion, HITACHI S-4800 is a powerful, highly precise, and flexible scanning electron microscope that is able to provide researchers and engineers with a great deal of information about the nanoscale structure and composition of materials. It is capable of producing high resolution and high contrast images with colorful visual features, useful for analyzing typical nanomaterials at high magnifications and angles. The automated sample stage greatly reduces sample mounting and positioning time, allowing for faster results, and the versatile detectors cover a range of applications for imaging and analysis.