Used HITACHI S-4800 #293604807 for sale

HITACHI S-4800 scanning electron microscope (SEM) provides superior image clarity and analytical accuracy, enabling the analysis of even the smallest targets and features. This high-performance instrument features a variable pressure system, and advanced automatic functions with high intuitive operability. HITACHI S 4800 is an optimal tool for a variety of applications, including failure analysis, design/process development, and material characterization. The modular structure of S-4800 allows for a variety of configurations to meet specific needs and budgets. This SEM has a cold cathode field emission gun (FEG) augmented by a three stage thermal column, allowing it to achieve a high level of resolution and contrast. The FE detector ensures detection of secondary electrons from all angles, preventing compromises between the acceleration voltage, image detail, and field of view. The electron beam can reach magnifications up to a maximum of x400,000, with a small probe current for low sample exposure. A vacuum chamber features a sample chamber with five different inlet/evacuation ports, enabling rapid and easy sample loading and exchange. With its tight pressure regulation, the automatic sample environment (ASE) offers an easy approach to low vacuum and environmental control applications. Optional technologies, such as energy dispersive X-ray spectroscopy (EDX), can be added to S 4800 depending on the purpose of application. HITACHI S-4800 also features a bright and clear LED display with an intuitive user interface. HITACHI S 4800 continues to be a valuable tool in the field of materials science and analysis. It provides advanced functions, superior image resolution and contrast, broad capabilities, and easy operation. With its modular structure, optional technologies, and its ability to work in a wide range of applications and conditions, its benefits are clear.