Used HITACHI S-4800 #293608598 for sale

HITACHI S-4800 scanning electron microscope is a robust, high-performance instrument that is capable of producing high-resolution images with remarkable clarity and detail. It is a powerful instrument suitable for a wide variety of applications from materials science to semiconductors, biology, and medicine. The instrument is based on a tungsten filament/electron gun, with a maximum accelerating voltage of 20kV. An adjustable pressure rotary vacuum system ensures reliable operation, with a base pressure of 2x10-7 Torr or below. HITACHI S 4800 features a combination of bright and dark field detectors, making it suitable for a variety of imaging and analytical needs. Images can be quickly acquired and stored, with an image size of up to 100,000 pixels. S-4800 offers a range of imaging modes and special acquisition modes including high contrast, polarization, and anotochromatic imaging. It also incorporates a collision shields system that can be used to reduce the energy spread of the electrons, providing better resolution and avoiding damage to fragile specimens. S 4800 comes with a number of software packages that provide the necessary control and management functions to ensure consistent and reliable performance. These include a fully automated system control, auto alignment, and a variety of image processing functions such as contrast and sharpness adjustments, surface topography mapping and line profile plotting. HITACHI S-4800 is also equipped with a range of integrated accessories for use in a variety of sample environments, such as HITACHI chillers, conventional cryogenics, autoorganization devices, high vacuum systems and a range of video systems. This broad range of accessories make HITACHI S 4800 particularly suitable for high throughput screening and categorization of samples. S-4800 is a versatile and user-friendly scanning electron microscope that offers a range of features and accessories for a wide variety of materials science applications. With its high-level of imaging performance and remote access capabilities, it is ideally suited to complex tasks such as failure analysis, product development, and materials investigations.