Used HITACHI S-4800 Type I #9160160 for sale
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ID: 9160160
Vintage: 2008
Field Emission Scanning Electron Microscope (FE-SEM)
With HORIBA EDX
Workstation: HP DC7100MT
Operating system: Windows XP
Resolution:
Accelerating voltage: 15 kV
Working distance: 4 mm to 1.0 nm
Accelerating voltage: 1 kV
Working distance: 1.5 mm to 2.0 nm
Magnification:
High magnification mode: 100x to 800,000x
Low magnification mode: 30x to 2,000x
Electron optics:
Electron gun: Cold cathode field emission type
Extracting voltage: 0 to 6.5 kV
Accelerating voltage: 0.5 to 30 kV (100 V Steps)
Lens: 3-Stage electromagnetic lens, reduction type
Objective lens aperture:
Movable aperture: 4 Openings selectable / Alignable outside column
Self-cleaning thin aperture
Electromagnetic astigmatism correction coil
Scanning coil: 2-Stages electromagnetic deflection type
Specimen stage:
X-Traverse: 0 to 50 mm
Y-Traverse: 0 to 50 mm
Z-Traverse: 1.5 to 30.0 mm
Tilt: -5° to 70°
Rotation: 360°
Specimen size: 4" (Airlock type)
Display unit:
Display type: Flicker free image on PC monitor
Viewing monitor: LCD, 18.1"
Type 21 color CRT (1280 x 1024 Pixels)
Photo CRT: Ultra-high resolution type
Effective field of view: 120 x 90 mm
Scanning modes:
Normal scan
Reduced area scan
Line scan
Spot analysis
Average concentration analysis
Split / Dual magnification
Scanning speeds:
TV: 640 x 480 Pixels display: 25 / 30 frames/s
NTSC / PAL Signal
Fast: Full screen display: 6.25 / 7.5 frames/s
Slow:
Full screen display: 1/0.9, 4/3.3, 20/16, 40/32, 80/64 frames/s
640 480 Pixels display: 0.5/0.4, 2/1.7, 10/8, 20/16, 40/32 frames/s
Photograph:
2560 x 1920 Pixels display: 40/32, 80/64, 160/128, 320/256 frames/s
Value of 50/60 Hz
Signal processing modes:
Automatic brightness control
Gamma control
Automatic focus
Automatic stigmator
Electrical image shift: ±12 um
Evacuation system:
Type: Fully automatic pneumatic-valve system
Vacuum levels:
Specimen chamber: 7 x 10^-4 Pa
Electron gun chamber:
IP-1: 1 x 10^-7 Pa
IP-2: 2 x 10^-6 Pa
IP-3: 7 x 10^-5 Pa
Vacuum pumps:
Electron optical system: (3) Ion pumps
Specimen chamber: Turbo molecular pump
Oil-less type
Compressor: Oil-less type
2008 vintage.
HITACHI S-4800 Type I is a scanning electron microscope developed and manufactured by HITACHI High-Tech Science Corporation. It is an ultrahigh resolution analytical scanning electron microscope (SEM) for visualizing and analyzing nanoscopic structures. With its unique performance advantages, the system provides best-in-class performance for imaging and analysis. S-4800 Type I is equipped with a high-performance SEM column which delivers unparalleled performance. It achieves an ultrahigh-resolution analytical image with a combination of cylindrical magnetic field lens and spherical field lens. This delivers 10 nm resolution at 10 kV - and also increases stability and improves imaging performance. Furthermore, it allows for reduction of the demagnetization rate, which ultimately leads to the highest performance without any compromise in image quality. To further improve performance and stability, HITACHI S-4800 Type I employs an external field source. This makes the microscope much more stable and also provides a better signal-to-noise ratio. The field source precisely controls the shape and strength of the beam electron path. This allows for imaging even with highly unstable objects. S-4800 Type I is ideal for research applications requiring exact measurement of materials and features. It comes with a variety of automated analysis functions, including; pattern recognition, quantitative measurement (area, length, width, etc), and crystal phase identification (through EDS analysis). It also features an integrated EDX detector, which allows rapid elemental analysis. Furthermore, the advanced automated search function allows easy navigation in a large sample field. HITACHI S-4800 Type I also offers a range of different modes for imaging and analysis. The high-resolution scanning mode ensures sharp and well-defined images. The low-noise detect mode allows precise analysis of delicate samples without connection with electrons. Additionally, the conductive image scan mode helps to obtain clear images of non-conductive surfaces. For an unbeatable performance, S-4800 Type I stands out as an ideal choice. Its ultrahigh-specification design ensures excellent imaging and analysis capabilities, while the range of automated functions make the system easy to use. With its reliable and superior performance, HITACHI S-4800 Type I is the perfect choice for advanced microscopy users.
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