Used HITACHI S-4800 #9184387 for sale

HITACHI S-4800 is a scanning electron microscope (SEM). It enables a user to analyze the morphological characteristics of surfaces, the size and shape of particles, and internal structure of compunds. It is useful for materials science and in many other fields. HITACHI S 4800 uses an electron column which is composed of an ion optical column, a condensor lens, a differential pumping chamber and a magnetic immersion lens. The column enables a high resolution imaging and a wide range of high and low acceleration voltage. Furthermore, it has an abberation corrector (AST) which provides high-quality images with reduced aberration. S-4800 has a secondary electron detector (SED), a backscattered electron detector (BSED) and a cathodoluminescence detector (CL). The detectors allow users to improve resolution, sensitivity and contrast. They also enable energy and elemental analysis. The CL detector can detect faint luminescent light effects of different materials to image the internal microstructure of the sample. S 4800 is also equipped with a possibility to measure the thickness characteristics of insulating films. This enables the analysis of such films sequences without dismantling them. Moreover, the integrated Energy Dispersive X-Ray Spectroscopy (EDS) provides elemental mapping of the sample surface. Additionally, HITACHI S-4800 is suitable for automated sample observation. An automated XY stage scan and an automated stage correction are available. The stable automated stage enables users to observe from which direction and where the sample was automatically observed. Overall, HITACHI S 4800 is an accurate and reliable scanning electron microscope that provides a range of features and functions for materials sciences and many other fields. It is an essential tool for making detailed observations and analyzing various properties at the nanometer level.