Used HITACHI S-4800 #9193432 for sale

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HITACHI S-4800
Sold
ID: 9193432
Vintage: 2008
Scanning Electron Microscope (SEM) With EDS 2008 vintage.
HITACHI S-4800 is an advanced scanning electron microscope with three detectors that can capture images of various surfaces with a high degree of resolution. The microscope utilizes a unique combination of electron optics that provide a wide field of view and a high degree of flexibility. The system includes an energy filters, a stage with motorized x y, drive, an interface that allows for remote operation and an electron energy gun. The motorized stage allows the user to easily move the specimen for an optimal view. It can accommodate various sample sizes up to 12 cm in diameter and up to 25 cm in height. Additionally, the user can also place sample holders on the stage, allowing for the observation of a large area. The specimen is placed in the vacuum chamber and illuminated with a beam of electrons. The primary electrons that interact with the sample generate secondary electrons and other types of signals. The scan area that HITACHI S 4800 can acquire is 2.5 cm x 2.5 cm and the resolution can range from 0.5 nanometers to 5 microns. The microscope also has an automatic feature for adjusting the working distance, aperture, magnification and field current. It also includes three detectors for secondary electron imaging and backscattering electron imaging. The secondary electron detector allows the user to image surface features and non-conductive specimens. The backscattering detector enables the user to observe a variety of materials, including metals, ceramics and semiconductors. This detector also has a polarized beam mode that allows the user to observe defects associated with crystal structures and oxides of the materials. In addition to imaging, S-4800 also features two optional detectors that allow for elements analysis and chemical imaging. With the addition of the optional detector, it is possible to observe chemical composition and elemental mapping of samples. The system also includes advanced software for quantitative analysis of the various signals that are generated by the detector. Overall, S 4800 is a powerful and versatile scanning electron microscope. It provides researchers with the tools to observe surfaces and structures with a high degree of resolution, as well as measure and analyze various signals for elemental and chemical analysis.
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