Used HITACHI S-4800 #9213997 for sale
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ID: 9213997
Vintage: 2010
Field emission scanning electron microscope (FE-SEM)
With EDX system
Sample loading systems: Transfer sample in inert gas vessel
Secondary electron image resolution:
1.0nm at 15 kV, WD=4mm
1.4nm at 1 kV, WD=1.5mm
Declaration mode:
2.0nm at 1 kV
WD: 1.5mm
Normal mode
Magnification:
LM Mode: 20x – 2,000x
HM Mode: 100x – 800,000x
Stigmator: Octopole electromagnetic
Scanning coil: 2-Stage electromagnetic electron optics
Electron gun: Cold cathode field emission source
Lens type: 3-Stage electromagnetic lens reduction system
Objective aperture: Variable type 4 position externally selectable
Sample chamber:
Size: Type I stage
Max sample size: Diameter, 4" (100mm)
Stage motion:
3-Axis motorized
X/Y: 0-50mm
R: 360 Deg continuous
Display system:
Image display
Full screen: 1,280 x 960 pixels
Dual display
Scanning speed:
TV: 25/30x2 frame/s
Fast: 6.25/7.5x2 frame/s
Slow: 1/4/20/40/80 s/frame or 5/2/10/20/40 s/frame
Signal selection:
SE Signal
X-Ray signal
AUX Signal
Vacuum system: Full automatic operation with pneumatic valve control
Ultimate vacuum:
Electron gun chamber: 10-7 Pa
Specimen chamber: 10-4 Pa
(3) Pumps:
Ion pump
Turbo pump
Oil rotary pump
Includes:
HORIBA 7593-H EMAX EDS/X system, 2010
Detection area: 30mm²
Window: ATW2
Resolution at 5.9 keV: 133eV
Vacuum pump: ULVAC GLD-136
Chiller: Eyela cool ace CA-1111
UPS
Operation manuals
2010 vintage.
HITACHI S-4800 scanning electron microscope (SEM) is a high performance and versatile microscope well suited for a variety of materials characterization applications. HITACHI S 4800 provides superior resolution and image quality by utilizing a dedicated ultra-high vacuums and a newly designed scintillator type. S-4800 uses a Schottky field emission electron gun which generates electrons with superior brightness and low beam divergence. The beam current is maintained at high levels over extended periods of time, producing high resolution images even at large magnifications. The electron gun is coupled with a newly designed scintillator type, which produces signal to noise ratio that is several times higher than conventional scintillators. S 4800 is also equipped with an in-lens secondary electron detector. This produces higher definition secondary electron images than can be achieved with an extra detector on the rear side of the sample stage. It is also suitable for a range of imaging conditions and can even be used with either low accelerating voltage or high accelerating voltage. In order to ensure stable performance at high magnifications, HITACHI S-4800 is equipped with an environmental chamber which minimizes the influence of external vibration. The low temperature operation mode allows low energy secondary electrons to be detected without significant thermal drift. HITACHI S 4800 also has a wide range of vacuum levels from ultra-high vacuums of 1 x 10-6 torr to a high vacuum of 4 x 10-2 torr, which allows for a variety of sample preparation, observation and analysis techniques. An automated sample changer and high level control system are available for researchers who require frequent utilization and for working with multiple samples. The control system enables automated operation and data analysis, allowing for greater research efficiency. S-4800 is a powerful, versatile and reliable scanning electron microscope that is suitable for a range of materials characterization applications. Its superior detection and imaging capabilities make it an excellent choice for researchers who require the highest quality images and data.
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