Used HITACHI S-4800 #9245925 for sale

HITACHI S-4800 is a scanning electron microscope (SEM) that is used for the analysis of different materials and for high-resolution imaging. It is capable of producing images with high magnification, high resolution, and high-efficiency. HITACHI S 4800 combines two imaging technologies: Secondary Electron (SE) and Backscattered Electron (BSE) imaging. The SE is used to detect the fine details of sample surfaces, while the BSE is used to detect and analyze the components of the sample's internal structures. The instrument is equipped with an interactive control equipment that enables users to adjust the image-capture parameters and adjust the microscope system settings. The unit also features various image-analysis functions, such as orientation histogram analysis, particle-size analysis, and phase analysis. The instrument utilizes an energy dispersive X-ray spectrometer (EDS) that is integrated with the SEM to analyze material microstructures. The machine is also equipped with an optional automated stage control tool, which allows users to automatically move the sample to various positions for imaging. S-4800 is also equipped with an optional stage heating asset that enables users to pre-heat or post-heat samples for higher contrast imaging. The stage heating model also enables users to anneal samples during imaging. Other useful features of the instrument include Deconvolution Imaging (DIM), Sample Rotator (SR), Aspect Ratio Control (ARC), and an internal computer to save images and data. The Deconvolution Imaging (DIM) enables users to sharpen the SEM images. The SR allows users to rotate the sample for imaging of different orientations. The ARC allows users to adjust the aspect ratio of the images. The instrument is a reliable, cost-effective SEM that is suitable for various types of applications. With its advanced features and capabilities, S 4800 is a versatile and user-friendly instrument that is capable of delivering high-quality images and data.