Used HITACHI S-4800 #9254505 for sale
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ID: 9254505
Vintage: 2008
Field Emission Scanning Electron Microscope (FE-SEM)
Secondary electron image resolution:
1.0 nm at 15 kV, WD: 4 mm
1.4 nm at 1 kV, WD: 1.5 mm
Declaration mode 2.0 nm at 1 kV, WD: 1.5 mm, Normal mode
Magnification:
LM Mode: 20x - 2,000x
HM Mode: 100x - 800,000x
Stigmator: Octopole electromagnetic
Scanning coil: 2-Stages electromagnetic electron optics
Electron gun: Cold cathode field emission source
Lens type: 3-Stages electromagnetic lens reduction system
Objective aperture: Variable type 4 position externally selectable
Sample chamber:
Size: Type I stage
Max sample size: Diameter, 4"
Stage motion:
3-Axis motorized
X/Y: 0-50 mm
Rotation: 360°
Display system:
Image display:
Full screen: 1,280 x 960 Pixels
Reduced area: 640 x 480 Pixels
Reduced area: 320 x 240 Pixels
(2) Dual images: 640 x 480 Pixels
Scanning speed:
TV (25/30 x 2 frame/s)
Fast (6.25/7.5 x 2 frame/s)
Slow (1/4/20/40/80 s/frame / .5/2/10/20/40 s/frame)
Signal selection:
SE Signal
X-Ray signal
AUX Signal
Vacuum system: Full automatic operation with pneumatic valve control
Ultimate vacuum:
10^-7 Pa in electron gun chamber
10^-4 Pa in specimen chamber
(3) Ion pumps
Turbo pump
Oil rotary pump
Includes:
UPS
ULVAC GLD-136 Vacuum pump
EYELA Cool Ace CA-1111 Chiller
Operation manuals included
2008 vintage.
HITACHI S-4800 Scanning Electron Microscope (SEM) is a powerful instrument that combines two imaging modalities - secondary electrons and backscattered electrons - to produce high-resolution images of a sample surface. HITACHI S 4800 equipment is equipped with a wide range of features and cutting-edge technologies, including a large working distance and advanced off-axis electron optics. S-4800 offers a high level of resolution and magnification, from less than 1 nm to over 500 nm, making it well-suited for a wide range of applications. The system is equipped with the latest off-axis lenses which allow for a large working distance and the possibility of transmitting up to 10kV electrons. It also has an automatic focusing capability and can project patterned images with high contrast. The unit's expandable chamber volume and flexible stage allow for the study of larger and thicker samples up to a maximum of 200 mm. The sample stage can be opened up to 810 mm inside the chamber, enabling the observation of larger and thicker samples with ease. S 4800 has a powerful Field Emission Source (FE-SEM) with a unique X-ray Source that allows for simultaneous Generation of X-ray signals from both electrons and ions. This feature is beneficial for qualitative and quantitative characterization of the sample surface. HITACHI S-4800 is designed for maximum performance, allowing for low noise and high-resolution imaging. The electronics on the machine has been designed for high stability, providing reliable performance and reliable results. HITACHI S 4800 tool is also equipped with an advanced high-speed imaging asset, which enables the user to capture high frame rate images. The model also features a full range of imaging tools for specimen analysis, such as surface mapping, digital image montages, 3D imaging, grain recognition, object identification, particle counting, surface area measurements, and thickness measurement. Finally, S-4800's user-friendly equipment makes it easy to navigate and control. An intuitive touchscreen interface and a comprehensive user manual make S 4800 the ideal SEM solution.
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