Used HITACHI S-4800 #9255305 for sale

HITACHI S-4800 scanning electron microscope (SEM) is a high performance, easy-to-use analysis tool that utilizes secondary electrons to enable fast and accurate surface analysis in a variety of materials. This SEM incorporates a variable pressure electron column that allows for a wide range of environmental conditions, enabling the imaging and analysis of samples without the need for sample preparation or specialized items. Its flexibility and ease-of-use make it an ideal instrument for a range of research institutions, academic institutions and industrial applications. HITACHI S 4800 features an electron source with a high brightness tungsten source capable of up to 20kV accelerating voltage. This source inherently reduces beam-disk current, resulting in a sharper image, with increased resolution and contrast. The electron gun is mounted onto a five-axis manipulator that increases positioning flexibility when conducting the imaging. S-4800 SEM incorporates an advanced low-vacuum electron column that is capable of operation between 10−3 to 10−8 mbar. This range of pressures allows for the investigation of environmental surface conditions without the need for sample preparation. The objective lens has a electron optical resolution of 24pm under ultrahigh vacuum conditions and up to 60 pm in mild environmentally conditions, while the detector system is able to detect low-energy electrons from a range of probes. In terms of imaging electronics, S 4800 features a variety of functions. These include an auto-focusing lens that compensates for any changes to the sample surface or geometric shape, and automatic adjustment of settings for enhanced image quality. The unit also features an image processing software package to manage data and create images. In terms of performance, HITACHI S-4800 is capable of producing high-quality images with minimal artefacts under a range of environmental conditions. It also offers the potential of spatial resolution of down to 3 nm in the STEM mode. Furthermore, in the normal scanning mode, the scanning rate has been increased by up to 30% of what would be conventional. In terms of safety and user-friendliness, HITACHI S 4800 comes with a dedicated particle shield that switches on when the beam is engaged to ensure the user is not exposed to the flow of electrons. S-4800 also offers one-button AutoEase operation, allowing the user to easily adjust emission current, accelerating voltage, magnification, image brightness and focus in any order.