Used HITACHI S-4800 #9257136 for sale

HITACHI S-4800 is a scanning electron microscope (SEM) designed for advanced imaging and analysis of materials and structures. It utilizes a range of electron sources and lenses, as well as highly sensitive detectors, to achieve high resolution imaging and characterization. HITACHI S 4800 is equipped with a secondary electron detector, a backscattered electron detector, and an Everhart-Thornley detector for obtaining appropriate secondary imaging information. S-4800 offers advanced imaging capabilities, such as semi-automatic focused ion beam (FIB) imaging, electron beam lithography, and a number of electron energy loss spectroscopy (EELS) and energy-dispersive X-ray spectroscopy (EDS) applications. S 4800 also has a built-in sample transfer chamber, allowing samples to be exchanged quickly and easily. HITACHI S-4800 offers a variety of imaging capabilities including secondary electron imaging, backscatter imaging, high resolution imaging, and wide-area imaging. It also has a high resolution analytical system which is capable of energy-dispersive X-ray spectroscopy (EDS) as well as elemental and phase mapping. The built-in image processing system is user-friendly and offers a variety of functions such as image measurement, phase reversal, and filtering options. HITACHI S 4800 also has advanced software for automated imaging, which enhances the scanning speed, data acquisition rate, and accuracy. S-4800 is designed for a wide variety of users, both in research and industrial settings. It is easy to operate and can be customized in various ways. S 4800 offers a range of features including a variety of vacuum systems and sample holders, an in-column focus detector, and an electron beam suppressor. It also offers a range of voltage settings for fine imaging and a wide range of operating parameters for customizing electromagnetic lenses and other components with precise resolution. Overall, HITACHI S-4800 scanning electron microscope is an advanced instrument designed for imaging, characterization, and analysis of materials and structures. It can be used to characterize flat or curved surfaces in both 2D and 3D applications. It combines a range of electron sources, lenses, and detectors to provide high resolution imaging capabilities. Additionally, it is user-friendly and easily configurable for most applications.