Used HITACHI S-4800 #9257544 for sale
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ID: 9257544
Field Emission Scanning Electron Microscope (FE-SEM)
For ultra high resolution imaging
With specimen exchange airlock
Detectors:
STEM
Yag backscatter
Magnification: 100x - 800,000x.
HITACHI S-4800 is an industry-leading scanning electron microscope that combines cutting-edge technology with unparalleled user convenience and reliability. This microscope enables a wide range of research applications, including microcrystallography, failure analysis, and nanotechnology. Its cutting-edge features include a high spatial resolution of 1 nanometer, a high depth of field of up to 15 µm, and a large field of view from 5 to 15 mm. This facilitates precise analysis of samples ranging from single crystal to nanoparticles. Additionally, HITACHI S 4800 has a large chamber size of 75 mm and a chamber window of 40 mm which allows for easy sample preparation and scanning. S-4800 is designed with a powerful cold-field emission electron-gun which has excellent beam stability and a very small source size of less than 4 nm diameter. It also has automatic beam-center alignment and dynamic focus control which contribute to improved image clarity and resolution. This allows less experienced users to obtain high-quality imaging without the need for manual adjustment. Furthermore, S 4800 provides an integrated mini-stage which ensures precise sample positioning and closed loop stage motion. This allows precise alignment and scanning of large samples. HITACHI S-4800 also features precise energy control with a beam current control that ranges from 1 nanoamp to 1000 nanoamps. The high-energy resolution of this microscope makes it useful for various imaging techniques such as photoelectron microscopy, elastic scattering imaging, and energy dependent contrast techniques. In addition, the microscope is equipped with a detachable secondary electron detector and electron stimulation detector that enables highly sensitive analysis for several applications. HITACHI S 4800 has a range of automated functions which allow hassle-free operation. These include an intuitive user interface, auto zoom, auto white balance, and auto brightness. Furthermore, the microscope has an integrated imaging capture and post-processing software that facilitates easy data sharing and archiving. With its excellent combination of powerful imaging capabilities, automated functions, and user convenience, S-4800 is a great choice for both experienced and novice electron microscopists alike.
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