Used HITACHI S-4800 #9266815 for sale

HITACHI S-4800 is an analytical scanning electron microscope (SEM) designed for high resolution imaging and analysis. The equipment is enabled with a range of sample preparation and measurement functions, allowing users to observe samples with elevated precision and accuracy. HITACHI S 4800 uses a sophisticated electron optic column to achieve the required magnifications and resolutions. It is composed of an electron gun, primary and secondary column electrodes, sample manipulation stage, and detectors. The electron gun is used to generate the electron beam which is directed towards the sample and projected onto the detector. The primary column electrodes focus the generated electron beam and the secondary electrodes position them at specific points. The sample manipulation stage is capable of translating and tilting the sample in order to acquire view it in multiple orientations. The detectors detect and collect the signals from the electron beam and transform them into digital image information. The SEM leverages field emission technology to enable high resolving power with low accelerating voltage. It also offers the automated control function for users to fine tune the electron optics for improved imaging and analysis. The system features a range of SEM detectors, such as secondary electron detectors, backscatter electron detectors, transmission electron detectors, and energy dispersive spectroscopy detectors, which allow users to analyze the elemental composition of a sample. S-4800 is outfitted with a number of measurement and image analysis software applications, including WDS and EDS, which provide comprehensive image processing, measurement, and analysis functions. Additionally, the unit is equipped with an advanced automation machine that allows users to record pre-defined laboratory procedures and carry out multiple processes, such as coating and observation, in a single scan. Overall, S 4800 is an ideal tool for advanced imaging, analysis, sample preparation, and measurement for a wide range of research and development applications. It has a large field of view, high resolution, and large depth of field, making it ideal for the investigation of materials such as metal, semiconductors, and biological specimens.