Used HITACHI S-4800 #9271037 for sale

It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.

ID: 9271037
Field Emission Scanning Electron Microscope (FE-SEM) With EDS Magnification: 30x, 800,000x Maximum sample size: 150 mm Accelerating voltage: 1.0 nm (15 kV) 2.0 nm (1 kV) Electron gun: Cold-cathode field emissions electron source Accelerating voltage: 0.5-30 kV (Variable steps 0.1 kV) Sample change: Air lock Detectors: Upper secondary electron detector Lower secondary electron detector EDS Detector Dry vacuum system With Turbo Molecular Pump (TMP) 3-Axes motorized stage With GUI Operating system: Windows XP.
HITACHI S-4800 Scanning Electron Microscope (SEM) is a high-resolution analytical instrument used for imaging and analyzing biological samples, nanostructures, and other specimen. This tool offers a high resolution of 3 nm, enabling the operator to clearly visualize small cells, proteins and other structures. With its energy-dispersive X-ray spectroscopy (EDS) detector and a high-sensitivity back-detector equipment, HITACHI S 4800 SEM can penetrate deeper into the sample layers to clearly image and analyze even very small structures. The system is equipped with a field emission gun. This gun provides greater electron emission with higher current intensity, enabling it to produce higher image quality, better resolution and contrast, and faster imaging speeds. The high-intensity electron beam generated by the gun unit is adjustable to a spot size ranging from 0.5 to 20.0μm. S-4800 SEM features a large chamber that can accommodate samples larger than those in a standard chamber, like biological and industrial samples. With its choice of detectors, this machine can be used to examine both magnetic and non-magnetic materials. The instrument is controlled by an intuitive interactive user interface, making the equipment easy to operate. This user-friendly interface allows efficient image acquisition from multiple directions in a single sample. The tool also comes with automated functions for quickly finding fine points, like measuring thickness and surface roughness. For Three-Dimensional Imaging, S 4800 features a Conoidal Scanning Mode that allows fast rate scanning and can also filter out unwanted background noise. This software also includes automatic alignment and stitching functions to create panoramic images quickly. HITACHI S-4800 comes with included Auto Focus and Autocontrast functions, making the asset more user-friendly and efficient. The included HDTV (High Definition Television) video port ensures that you can view your images in high resolution. HITACHI S 4800 also includes an interface to fast Ethernet and optional video output support, giving practitioners the ability to transfer data to other computers, which can save a tremendous amount of time. Overall, S-4800 SEM is a highly advanced scanning electron microscope with powerful features for studying even the finest details in biological, industrial and nanostructural samples. Its high resolution and EDS detector provide image quality and analysis clarity, and its versatile chamber, user interface and EDX controls make operating and analyzing samples easier, quicker and more accurate.
There are no reviews yet