Used HITACHI S-4800 #9301763 for sale

HITACHI S-4800 is a scanning electron microscope (SEM) that is used for imaging and analysis of specimens at high resolution. It works on the principle of secondary electron imaging, which uses an electron beam incident on the specimen surface to produce images. The SEM includes an integrated microanalysis system using energy-dispersive x-ray spectroscopy (EDS) for elemental analysis along the line of sight of the electron beam. The image is acquired by the measurement of the secondary electrons emitted from the specimen surface when interacted with the primary electron beam of a certain energy. HITACHI S 4800 SEM offers many features and benefits, such as automatic operation and its integrated microanalysis capabilities. The instrument offers a high resolution of 1 nm, with a maximum operating voltage of 500 kV, and a high definition testing mode that allows finer details of the specimen to be seen in the images. S-4800 SEM is equipped with two different detectors, including a high resolution SEM detector, and a Peltier-cooled backscattered electron detector. The SEM detector is used for standard imaging, while the detector with Peltier cooling enables the detection of lower energy backscattered electrons for better contrast of the image produced. It is further equipped with a three axis sample stage with a maximum movement of 74 mm, making it suitable for large samples. S 4800 also includes a software package for data acquisition, data analysis, and 3D reconstruction. This software includes functions for microscope control, image analysis, digital filtering, pattern recognition and measurement tools. It also includes other tools for data storage and display. Additionally, HITACHI S-4800 is integrated with an optional "InFocus" camera, which sends real-time images to the monitor via a USB connection. It further allows the user to choose between two imaging modes - brightfield mode and darkfield mode. The brightfield mode is suitable for microorganisms and small cells, while the darkfield mode is more suitable for observing fine structural features of objects. Overall, HITACHI S 4800 is a versatile and high performing scanning electron microscope that offers a range of image and analysis options. It can be used for a variety of imaging and analysis tasks, including imaging of cells and nanostructures, identification of chemical elements, and three dimensional reconstruction of complex features.