Used HITACHI S-4800 #9351385 for sale

HITACHI S-4800 is a versatile and powerful scanning electron microscope (SEM) that is well-suited for a variety of applications including imaging, elemental analysis, and surface analysis. HITACHI S 4800 features a unique variable pressure mode, allowing a variety of specimen types, sizes, and shapes to be observed without sacrificing performance. Equipped with a large chamber and high magnification capabilities, S-4800 is capable of inspecting both large and small features of complex samples while also providing a high resolution image. S 4800 has a field emission gun, which increases the spatial resolution of the microscope. Additionally, the gun allows for a low metal contamination of the sample that is observed, resulting in higher contrast images of the sample. The SEM is equipped with a standard camera allowing users to quickly and easily capture images of the sample and save them for later analysis. The images from HITACHI S-4800 can also be used for automated measurements and calculations, making it an ideal instrument for automated data collection and analysis. For elemental mapping and analysis, HITACHI S 4800 has an energy-dispersive X-ray spectroscopy (EDS) capability. The EDS allows users to perform rapid and non-destructive elemental analysis of the sample. Fast elemental analysis makes S-4800 is capable of identifying and quantifying different elements in the sample quickly and accurately. S 4800 also features a thermal emission system (TEM) mode, which can measure the contact potential difference (CPD) of a sample, which is essential for understanding semiconductor material properties. HITACHI S-4800 also provides unique capabilities for surface inspection of 3D samples. Its low magnification mode allows users to quickly identify any surface defects on a sample, while high magnification allows for detailed surface mapping. The surface imaging is enhanced by the use of an Electron Backscatter Diffraction (EBSD) system which allows for the surface orientation mapping of a sample by capturing the orientation of crystal lattices. The EBSD is also capable of measuring strain, crystallinity, and texture of a sample. HITACHI S 4800 has a wide range of features that makes it an ideal instrument for a variety of applications. Its large chamber, high resolution, EDS, TEM, and EBSD capabilities makes S-4800 well-suited for imaging, elemental analysis, and surface analysis applications, as well as automated data collection and analysis. S 4800 provides a powerful and intuitive scanning electron microscope that offers enhanced performance for users of all levels of SEM proficiency.