Used HITACHI S-4800 #9354488 for sale

ID: 9354488
Wafer Size: 8"
Vintage: 2006
Field Emission Scanning Electron Microscope (FE-SEM), 8" High resolution cold field emission 5-Axis motorized eucentric stage Dry vacuum system Resolution: 1.4 nm at 1 kV with beam deceleration technology 0 nm at 15 kV with ExB filter technology 2006 vintage.
HITACHI S-4800 is an advanced scanning electron microscope (SEM) that provides powerful imaging capabilities and surpasses the limits of traditional SEM systems. It features high resolution, wide field-of-view, 3D capabilities, and enhanced low-vacuum operation. HITACHI S 4800 has an ultra-high resolution field emission gun (FEG) with a B SE detector, enabling it to take extremely detailed images at magnifications up to 500,000 times. It boasts a large working distance of up to 200mm and a wide field-of-view of up to 140mm, allowing it to image a wide range of sample sizes. With advanced 3D image construction capabilities, it can produce highly accurate 3D models of objects with complex geometries. S-4800 is engineered for maximum flexibility, with a range of sample holders, stages, and accessories available. It is highly user-friendly, with intuitive software and a simple but effective touchscreen control panel. S 4800 is designed to operate at low-to-moderate vacuum levels of up to 1.3×10-2 Torr. This low-vacuum operation greatly reduces sample charging and production of secondary electrons, allowing it to image non-conductive samples even with low beam currents. In addition, it utilizes TOF type secondary electron emission detectors, enhancing image brightness and contrast while also allowing imaging of light elements such as boron. HITACHI S-4800 is an ideal choice for many imaging applications, such as materials science, semiconductor process development, and biology. Its combination of high resolution, wide field-of-view, and low-vacuum operation make it an excellent tool for studying a wide range of specimens.
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