Used HITACHI S-4800 #9384763 for sale

HITACHI S-4800
ID: 9384763
Vintage: 2006
Scanning electron microscope (SEM) 2006 vintage.
HITACHI S-4800 scanning electron microscope (SEM) offers the highest resolution capabilities available in today's scanning electron microscopy field. This exceptional capability allows users to yield unrivaled image quality through sophisticated imaging and analysis. Boasting a resolution of 1.3 nm and working distances of 6mm to 139mm, HITACHI S 4800 offers max utility. The features of the SEM enable clarity, allowing for detailed visualizations of microscopic samples. The highest resolution is attained through a secondary electron detector and a new BSE (HighBright) detector as well as an energy-dispersive X-ray detector. These three works in tandem to achieve the best resolution available. With this state-of-the-art instrumentation, the SEM can collect larger and more detailed data sets from particles present in the samples. An in-lens electron detector with a special mini lens gives images a higher contrast than any other SEM. The user-friendly operation of S-4800 affords a great benefit for both new and seasoned users. It offers a robustness include multiple functional scan modes, computer-controlled motorized stage, electronically modulated beam-to-specimen distance control, as well as a liquid nitrogen cooled EDS (energy-dispersive X-ray spectrometer) option. In addition, S 4800 features a charge detector to minimize electron sample interaction. It also includes an analysis software suite (SourceEazy), which boasts an intuitive GUI, which allows users to perform powerful analysis on their sample data—while investing minimal effort in operation. Designed with an intuitive touch panel, HITACHI S-4800 offers an unprecedented level of user convenience. Last but not least, HITACHI S 4800 offers enhanced imaging capabilities at unparalleled resolution. Its scanning electron microscope function images with 1.3 nm resolution, allowing for imaging of particles and small samples. S-4800 also enhances the spatial and surface distribution of the sample, allowing easier scanning and higher resolution imaging. Overall, S 4800 scanning electron microscope is the most advanced microscope in its class, offering unbeatable resolution and user-friendly operation. This SEM is the perfect choice for advanced applications, giving researchers and scientists a detailed view of their samples and more in-depth analysis capabilities. HITACHI S-4800 is an unbeatable combination of leading-edge imaging and analysis capabilities.
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