Used HITACHI S-4800 #9387882 for sale

HITACHI S-4800 is a non-destructive, high-resolution scanning electron microscope (SEM) with a low vacuum mode operating at a pressure range of 10-2 - 10-7 mbar. With this SEM, imaging of non-conductive and conductive samples is possible at resolutions of 20 nm, enabling structural and morphological features of samples to be analyzed in detail. HITACHI S 4800 features an accurate and reliable motorized specimen stage with a scanning size of 200 mm in the X-axis, 100 mm in the Y-axis, and 5 mm in the Z-axis. This enables operators to cover a large area with a single scanning process; this, combined with the SEM's fast scan speed and on-board image processing functions, increases efficiency and reduces scanning time. With a large depth of field, S-4800 is also capable of high-magnification imaging. A variety of imaging modes are available on S 4800, including secondary electron (SE), backscattered electron (BSE), transmitted electron (TE), combined SE and BSE, combined SE and TE, and variable pressure imaging (VPI) imaging modes. Each mode has its own characteristics, making it applicable to various types of sample materials. HITACHI S-4800 also boasts an automated image processing equipment to enable rapid data analysis, as well as various add-on functions to enable even further sample analysis. These include an automated particle size and shape analysis system, a three-dimensional sample analysis unit, an automated mapping machine, and an energy dispersive x-ray analysis tool. HITACHI S 4800 features a high quality digital imaging asset, providing better contrast and clarity than conventional film-based systems. A digital camera can be used for fast, accurate focusing and a range of image enhancements and manipulations, such as image mosaicking, image stitching and image processing. S-4800 can also be incorporated into a multi-user working environment, and with a range of data output formats, results can be laid out in a variety of ways, enabling easy comparison and analysis between different samples. Overall, S 4800 is an advanced scanning electron microscope, delivering precise, high resolution imaging of a range of samples with a variety of imaging modes and add-on functions, enabling further detailed analysis. The machine is ideal for quality control and research applications and is a powerful, versatile tool for the analysis of various materials.