Used HITACHI S-4800 #9399570 for sale

HITACHI S-4800 scanning electron microscope is an advanced imaging and analytical instrument designed for a wide range of materials science and nanoscale research. It operates on the principle of scanning electron microscopy (SEM): a high-energy electron beam scans across a sample to produce a detailed three-dimensional image, from which dimensional measurements, elemental composition and even surface topography can be extracted. HITACHI S 4800 provides a variable range of magnification from 50x to 500,000x, enabling researchers to study everything from microorganisms to nanoscale surfaces. Its superior performance is a result of innovative design features including a compact and rigid column, a high-speed field emission gun, a high-power low-speed Bessel column, and an assortment of advanced lenses and filters. The microscope makes use of a wide range of detectors, including a secondary electron detector, a backscattered electron detector, an X-ray detector and an energy-dispersive X-ray detector. Combined with advanced software, these detectors give researchers the ability to visualize both topographical and elemental information at the nanoscale level. S-4800 also provides a number of analytical capabilities, such as energy dispersive spectroscopy (EDS) and electron energy loss spectroscopy (EELS). These techniques allow researchers to study signals that give information on the chemical composition and healing state of samples at a molecular level. S 4800 is designed to meet the stringent demands of modern materials analysis. Its ergonomic design and intuitive user interface allow for precise and accurate operation, while its variable-temperature stage, refrigeration unit, and motorized tilting control offer advanced sample handling capabilities for a wide range of materials. In summary, HITACHI S-4800 scanning electron microscope is an ideal instrument for materials science and nanoscale research. It offers a range of advanced features to study the structure and composition of materials, from the macro- to nanoscale level. Its superior imaging, analytical and sample handling capabilities make it an invaluable tool for a wide range of research applications.