Used HITACHI S-5000 #293628551 for sale
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ID: 293628551
Vintage: 1998
Scanning Electron Microscope (SEM)
Magnification: 250x - 300,000x
Does not include EDX
Power supply: 10kV
1998 vintage.
HITACHI S-5000 scanning electron microscope (SEM) is a versatile and reliable instrument capable of automatic and high-magnification optical and electron imaging. The instrument is designed to maximize detection of small, subtle features while providing comprehensive view at the micro- and nanoscale. The instrument is an advanced, high-resolution SEM instrument capable of analyzing small structures with excellent resolution. The imaged features include micro- and submicron features, crystalline structures, noble metals, organic molecules, and other material details. The high-magnification capabilities allow for analysis of small, intricate features with a resolution of 5 nm. The instrument is also equipped with a range of detectors, including secondary electron, scattered electron, and several imaging detectors. These detectors offer a range of imaging capabilities to identify and categorize different material properties. The instrument is also capable of advanced image manipulation and feature extraction. This is done through automated image processing techniques and allows for convenient data manipulation of derived images. The instrument is also equipped with an automated sample stage and external hardware to facilitate the positioning of samples within the available imaging field of view. The instrument is equipped with multiple scanning modes, including high-resolution and low-magnification scan modes. This provides the researcher with the ability to capture various images with different magnifications for further analysis. The mechanical design of HITACHI S 5000 is reliable and easy to use. The instrument features an intuitive user interface, making it easy to use and operate. In addition, the instrument features a range of advanced safety features, making it ideal for operation in sensitive laboratory environments. S-5000 is an advanced, reliable and efficient instrument capable of helping researchers to visualize and analyze features at the micro- and nanoscale. Its powerful imaging, automated sample stage, and reliable mechanics speak to its ability to deliver superior results.
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