Used HITACHI S-5000 #293632287 for sale
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ID: 293632287
Vintage: 2000
Field Emission Scanning Electron Microscope (FE-SEM)
Electron gun: Cold field emission type
Built-in butter type
Lens system: 3-Stage electromagnetic lens reduction method
Objective lens: Movable aperture
Stigma toll: 8-Pole electromagnetic system
Deflection coil: 2-Stage
Secondary electron resolution:
0.6 nm Acceleration voltage: 30 kV
30 nm Acceleration voltage: 1 kV
Magnification:
LM Mode: 30x - 500x
HM Mode: 250x - 800,000x
Sample fine movement device:
Side entry method
Movement stage:
X-axis: ± 3.5 mm
Y-axis: ± 2 mm
T-axis: ± 40°
Stage control: Movement speed switched in 3 steps
Sample size: 9mm x 5 mm x 2.4 mm, 9.5 mm x 5 mm x 4.4 mm
Sample exchange: Airlock method
Display:
Secondary electron image
Still image display with built-in image memory
Image memory:
Pixel high-definition memory two sides
Photographing of high-definition 1024 x 1024 image
Real-time TV display of slow scan image
Image integration on TV and first scan
Real-time histogram display
4-Split image display
Acceleration voltage: 0.5–30 kV (0.1 kV step)
2000 vintage.
HITACHI S-5000 is an advanced scanning electron microscope (SEM) designed for a variety of materials and industries. The equipment features an ultra-high resolution scanning electron column with an analytical resolution down to 0.8nm, allowing for the highest resolution imaging and elemental analysis. This advanced column has an accelerating voltage up to 30 kV and variable water-cooled electron source to ensure reliable operation and quality analysis results. The system is equipped with a two-position sample stage, allowing for the easy transfer of specimens between two pre-positioned stages and easy specimen exchange. The unit is also equipped with a dual-tilt function, allowing for specimen tilting in both directions for non-oriented applications. The machine can be equipped with a wide range of detectors, to allow for advanced imaging and analysis, including an Everhart-Thornley Detector and a Backscattered Electron Detector. This enables the user to capture essential information in the form of images and data, as well as to perform compositional analyses such as Energy Dispersive Spectroscopy (EDS). In addition, the tool also includes an automated chromium/gold coating unit, enabling coating of specimens prior to analysis, in order to generate a conductive surface that aids in analysis. This asset also includes automated focus and stigillation functions, allowing for easy alignment and operation. Finally, the model is equipped with an advanced controller, providing access to an intuitive user interface, easy workflow management and advanced data control. In addition, the equipment is also capable of outputting data in a variety of industry-standard formats, allowing for compatibility with industry-standard software packages. HITACHI S 5000 is an industry-leading SEM designed for a variety of materials and industries. Its ultra-high resolution capabilities and advanced features make it an ideal choice for anyone seeking detailed images and data, accuracy and repeatability.
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