Used HITACHI S-5000 #293652755 for sale

HITACHI S-5000
ID: 293652755
Wafer Size: 4"
Scanning Electron Microscope (SEM), 4".
HITACHI S-5000 is a scanning electron microscope (SEM) that gives researchers the ability to capture detailed images of a sample in a fast and efficient manner. The unit offers a variety types of capabilities and features to its users. The unit is equipped with a tungsten filament emitter that provides a beam of electrons with a working voltage range between 0.1 and 30kV and a working current range of 0.01 to 0.53 nanoAmps. It has a digital control equipment which allows for great flexibility and accuracy in the experiment setup and operation. The automatic beam centering and focus of the SEM is improved by the use of its sub-nanometer precision stage. In addition, the image contrast and resolution is enhanced with its EDS (energy-dispersive spectroscopy) and EBSD (electron backscatter diffraction) detectors. The size of the field of view supported by the SEM is up to 100mm2 with a 3kw X-ray source and a four-blade aperture. It has a variable contrast function that can be used to adjust the images depending on the application and the samples it is being used with. The maximum magnification of images captured with the unit is up to 100,000x with a resolution of 35nm. The unit is equipped with a cooling mechanism that can lower the temperature by up to -45 degrees Celsius to facilitate low-temperature operation when needed. The SEM's user-friendly interface provides good control and observation of the sample. It includes a motorized stage, a multi-language touch-screen LCD panel, a direct-drive motor table for fast scan motions, and a FPD digital camera for real-time imaging. This panel also allows the user to access various plugins and control settings for data input and output. At the core of HITACHI S 5000 SEM is its SIMS (secondary ion mass spectrometry) system which provides mass spectra of the sample material being analyzed. This unit is extremely useful for obtaining elemental composition and identifying surface features. S-5000's dual digital image processing systems provide real-time images for analysis and determination of both quantitative and qualitative properties of the samples. Lastly, S 5000 also supports essential safety functions such as the automatic shut-off of the electron beam when the sample or the sample holder is moved. Overall, HITACHI S-5000 provides a wide range of capabilities to help researchers capture high-resolution images of samples faster and with improved accuracy. The dual digital imaging machine, energy-dispersive spectroscopy and electron backscatter diffraction, and safety functions are all helpful in ensuring researchers attain optimal results with the SEM.
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