Used HITACHI S-5000 #293665941 for sale

HITACHI S-5000 is a scanning electron microscope (SEM) designed to obtain high-resolution images of micro-structures and nano-structures. HITACHI S 5000 has a digital image capture equipment to accurately acquire, analyze, and produce high-quality images. Its digital image capture system allows for fast and accurate image acquisition, real-time data tracking and image processing. Its powerful processing capabilities, along with its high-class optics, provide excellent images over a large range of magnifications. S-5000 is capable of producing secondary and backscattered electron (SE/BSE) imaging. Secondary electrons are emitted from the sample surface when irradiated by primary or backscattered electrons. The images generated provide information of the sample surface composition and topography. BSE imaging utilizes electrons backscattered from the sample surface and artifacts. The BSE electrons are collected through a chromium coated grid in the acceleration chamber. Backscattered electron imaging can provide more information about the sample than standard SE images. S 5000 also has an automated lens alignment unit for SEM imaging, which helps to reduce the amount of time needed for performing multiple images and hence increase efficiency. Its automated focus machine can assist in obtaining sharper images for improved clarity. The digital image capture and control tool in HITACHI S-5000 consists of an adjustable digital video camera for SEM imaging. The digital video camera is capable of generating both high magnification and low magnification images of the sample. This allows for more detailed imaging of sample features while still providing feedback on larger objects. To improve the image contrast, HITACHI S 5000 includes an array of different modes. These include brightfield, darkfield, and contraste imaging. Brightfield mode is used for imaging non-conductive samples. Darkfield imaging uses dark polarization to attain high levels of contrast. Contrast imaging is used for analyzing different regions of a sample in order to obtain more detailed information. In addition to the digital image capture and control asset, S-5000 also includes a surface mapping model. This equipment functions to measure the surface topography with sub-nanometer resolution. It utilizes four electrostatic sensors attached to the SEM chamber which measure the exact position of the sample's surface. S 5000 offers a wide range of features and functions for acquiring high-resolution images. With its high power optics and automated systems, HITACHI S-5000 is the ideal tool for advanced research in materials science, nanotechnology, and microscopy applications.