Used HITACHI S-5000 #293748019 for sale

HITACHI S-5000 is a field emission scanning electron microscope (FE-SEM) designed for applications that require top-of-the-line performance for imaging very small objects or features. It has a large chamber for specimens up to 300 mm in diameter, and features high information transfer rates, improved analysis capabilities, and the ability to scan in both bright and dark field modes. HITACHI S 5000 is equipped with a 10 nanometer resolution capability, which makes it ideal for applications that require precision and detail. Its high-voltage imaging circuitry runs up to 30 kV, allowing it to penetrate deep into the sample and enabling imaging of very thin layers just a few nanometers in depth. S-5000 is also equipped with a highly sensitive 5-axis stage. This stage is accurate up to 0.07 µm and can scan in any direction, at any angle, and in two modes: short-field (SF) scanning for superior resolution, and long-field (LF) scanning for wider field of view imaging. To facilitate imaging, S 5000 also has an automated measurement capability, including automatic tilt correction, which can be set to correct for an angle error of up to 3° without the need for manual control, thus ensuring precise image registration. The SEM can be used to collect data from multiple materials. It works with standard electrical and mechanical probes, such as needles, cantilevers, and other stylus-type probes, and can be used to measure a variety of electrical and optical characteristics, such as impedance and luminescence. The system also has a wide range of additional features, such as an optical image detector that can be used for transmission electron microscopy (TEM) imaging, long-life field emission electron sources for long period uninterrupted operation, and a computer system that enables complex image processing and provides the ability to access remote sites for direct access control over HITACHI S-5000's functions. Overall, HITACHI S 5000 is an excellent choice for investigators requiring precise imaging with high resolution, low noise, and fast data collection. Its advanced features and capabilities make it suitable for a wide range of applications, such as material science, microelectronics, and nanotechnology research.