Used HITACHI S-5000 #293830287 for sale

HITACHI S-5000
ID: 293830287
Scanning Electron Microscope (SEM).
HITACHI S-5000 is a scanning electron microscope (SEM) that utilizes secondary electrons to produce high-resolution and high-contrast images and three-dimensional surface images of samples. HITACHI S 5000 features a classically-configured scanning electron optics consisting of two pairs of electromagnetic lenses which, when combined with a variety of optional lenses and accessories, enables high-resolution imaging at magnifications ranging from 100X to 1,000,000X. S-5000 is designed to meet the specific requirements of a wide variety of analytical applications, such as conventional SEM and variable pressure (VP-SEM) analysis. S 5000 also offers a wide variety of accessible energy filters and detector options, as well as backscattered electron (BSE), secondary electron (SE), and cathodoluminescence (CL) imaging modes. Furthermore, HITACHI S-5000 has recently acquired an atomic force microscope (AFM) capability. Additionally, HITACHI S 5000 is designed with a compact and ergonomic layout, allowing users to easily view the sample during both the imaging and analysis processes. This is supported further by automated stages, with capabilities to support large samples and 360-degree observation, along with automated sample search features equipped with auto-focusing capability. Finally, S-5000 offers numerous advanced technological features. This includes the inclusion of an energy dispersive X-ray (EDX) detector for elemental analysis, an ion beam detector for high resolution imaging, an scanning ion microscope (SIN) for collecting images at ultralow voltage and retrieving data from a distance, and an in-column detector with an image intensifier for imaging and 3D analysis of delicate samples. As a result, S 5000 provides a diverse range of imaging capabilities and unlimited opportunities for its users.
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