Used HITACHI S-5000 #51610 for sale

HITACHI S-5000 Scanning Electron Microscope (SEM) is a powerful tool optimized for superior resolution and productivity in the electronics and materials industries. This SEM produces high-resolution imaging with exceptional speed and accuracy, making it the perfect choice for imaging demanding materials and devices. HITACHI S 5000 also offers an impressive range of analysis capabilities, making it one of the most advanced instruments available. S-5000 is designed with a number of features to optimize high-resolution imaging. At the heart of the equipment is a High Performance SE Detector, which allows for shorter imaging times, higher resolution, and greater count rate than previous models. The system also includes SuperSpeed Scan Control technology, which allows for faster, more precise movement and placement of the scan pattern across the specimen, resulting in high-quality imaging with a minimal loss of resolution. In addition, the SEM includes a Digital Signal Processor (DSP) to ensure more accurate measurements of the sample. S 5000 provides a true quantitative analysis capability, with powerful automated software solutions for QuickScan and TotalAnalysis. QuickScan offers automated easy-to-use functionality for analyzing flat samples and allows for faster sample imaging and specimen analysis. TotalAnalysis provides enhanced data acquisition capabilities, allowing for the simultaneous acquisition of images and EDX signals. This feature enables the detection of small particles, the analysis of heavy elements, and the observation of a wide range of material properties. HITACHI S-5000 also offers a large selection of built-in software and programming packages designed to meet the needs of a diverse range of applications. Connectivity options include a 10/100 BaseT Ethernet connection, digital signal I/O, and a USB port for the direct transfer of data. HITACHI S 5000 utilizes a variety of detectors for a wide range of imaging needs, including Secondary Electron (SE) imaging, Secondary Ion (SI) imaging, Backscatter Electron (BSE) imaging, and Cathodoluminescence (CL) imaging. In addition to an impressive range of imaging capabilities and analysis packages, S-5000 is designed to meet the safety and ergonomic requirements of the most demanding environments. The workstage has a tilting theta axis and an automated five-axis unit, which allows the SEM to be used in manual or automated modes. The machine is equipped with an oversized color LCD monitor and an intuitive manual control tool with soft-key controls and a slider bar to control the optical current. In conclusion, S 5000 Scanning Electron Microscope is an advanced, powerful instrument, offering advanced imaging and analysis capabilities for the most challenging applications. Its robust design and safety features provide reliable performance in a wide variety of work environments, making it an ideal choice for precision imaging and analysis.